HUMLÍČEK, Josef. Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys. Thin Solid Films. UK Oxford: Elsevier science, 1998, vol. 1998, 313-314, p. 656-660. ISSN 0040-6090.
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Basic information
Original name Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys
Authors HUMLÍČEK, Josef.
Edition Thin Solid Films, UK Oxford, Elsevier science, 1998, 0040-6090.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher United Kingdom of Great Britain and Northern Ireland
Confidentiality degree is not subject to a state or trade secret
Impact factor Impact factor: 1.019
Organization unit Faculty of Science
UT WoS 000073761700119
Keywords in English ellipsometry
Tags ellipsometry
Changed by Changed by: prof. RNDr. Josef Humlíček, CSc., učo 307. Changed: 11/5/1999 09:16.
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