Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys

HUMLÍČEK, Josef. Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys. Thin Solid Films. UK Oxford: Elsevier science, 1998, vol. 1998, 313-314, p. 656-660. ISSN 0040-6090.

Basic information

Original name

Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys

Authors

HUMLÍČEK, Josef

Edition

Thin Solid Films, UK Oxford, Elsevier science, 1998, 0040-6090

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Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10302 Condensed matter physics

Country of publisher

United Kingdom of Great Britain and Northern Ireland

Confidentiality degree

není předmětem státního či obchodního tajemství

Impact factor

Impact factor: 1.019

Organization unit

Faculty of Science

UT WoS

000073761700119

Keywords in English

ellipsometry

Tags

ellipsometry