| HOLÝ, Václav, A.A. DARHUBER, J. STANGL, G. BAUER, J. NUTZEL and G. ABSTREITER. X-ray reflectivity investigations of the interface morphology in strained SiGe/Si multilayers. Semicond. Sci. Technol. UK: Publishing Ltd, 1998, 13(1998), -, p. 590-598. ISSN 0268-1242. |
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@article{200358,
author = {Holý, Václav and Darhuber, A.A. and Stangl, J. and Bauer, G. and Nutzel, J. and Abstreiter, G.},
article_location = {UK},
article_number = {-},
keywords = {x-ray},
language = {eng},
issn = {0268-1242},
journal = {Semicond. Sci. Technol.},
title = {X-ray reflectivity investigations of the interface morphology in strained SiGe/Si multilayers},
volume = {13(1998)},
year = {1998}
}
TY - JOUR
ID - 200358
AU - Holý, Václav - Darhuber, A.A. - Stangl, J. - Bauer, G. - Nutzel, J. - Abstreiter, G.
PY - 1998
TI - X-ray reflectivity investigations of the interface morphology in strained SiGe/Si multilayers
JF - Semicond. Sci. Technol.
VL - 13(1998)
IS - -
SP - 590
EP - 590
PB - Publishing Ltd
SN - 02681242
KW - x-ray
ER -
HOLÝ, Václav, A.A. DARHUBER, J. STANGL, G. BAUER, J. NUTZEL and G. ABSTREITER. X-ray reflectivity investigations of the interface morphology in strained SiGe/Si multilayers. \textit{Semicond. Sci. Technol.}. UK: Publishing Ltd, 1998, 13(1998), -, p.~590-598. ISSN~0268-1242.
|
