| OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL, Martin VIČAR a Petr KLAPETEK. Comparison of AFM and optical methods at measuring nanometric surface roughness. In Proceedings of the 3th Seminar on Quantitative Microscopy. Braunschweig, SRN: Physikalisch-Technische Bundesanstalt, 1998, s. 123-129. ISBN 3-89701-280-4. |
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@inproceedings{206012,
author = {Ohlídal, Ivan and Franta, Daniel and Ohlídal, Miloslav and Vičar, Martin and Klapetek, Petr},
address = {Braunschweig, SRN},
booktitle = {Proceedings of the 3th Seminar on Quantitative Microscopy},
language = {eng},
location = {Braunschweig, SRN},
isbn = {3-89701-280-4},
pages = {123-129},
publisher = {Physikalisch-Technische Bundesanstalt},
title = {Comparison of AFM and optical methods at measuring nanometric surface roughness},
url = {http://hydra.physics.muni.cz/~franta/bib/PTBF34_123.html},
year = {1998}
}
TY - JOUR
ID - 206012
AU - Ohlídal, Ivan - Franta, Daniel - Ohlídal, Miloslav - Vičar, Martin - Klapetek, Petr
PY - 1998
TI - Comparison of AFM and optical methods at measuring nanometric surface roughness
PB - Physikalisch-Technische Bundesanstalt
CY - Braunschweig, SRN
SN - 3897012804
UR - http://hydra.physics.muni.cz/~franta/bib/PTBF34_123.html
N2 - In this contribution a comparison of the values of basic quantities characterizing random nanometric surface roughness determined by AFM and optical methods is presented.
ER -
OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL, Martin VIČAR a Petr KLAPETEK. Comparison of AFM and optical methods at measuring nanometric surface roughness. In \textit{Proceedings of the 3th Seminar on Quantitative Microscopy}. Braunschweig, SRN: Physikalisch-Technische Bundesanstalt, 1998, s.~123-129. ISBN~3-89701-280-4.
|
