OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL, Martin VIČAR a Petr KLAPETEK. Comparison of AFM and optical methods at measuring nanometric surface roughness. In Proceedings of the 3th Seminar on Quantitative Microscopy. Braunschweig, SRN: Physikalisch-Technische Bundesanstalt, 1998, s. 123-129. ISBN 3-89701-280-4. |
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@inproceedings{206012, author = {Ohlídal, Ivan and Franta, Daniel and Ohlídal, Miloslav and Vičar, Martin and Klapetek, Petr}, address = {Braunschweig, SRN}, booktitle = {Proceedings of the 3th Seminar on Quantitative Microscopy}, language = {eng}, location = {Braunschweig, SRN}, isbn = {3-89701-280-4}, pages = {123-129}, publisher = {Physikalisch-Technische Bundesanstalt}, title = {Comparison of AFM and optical methods at measuring nanometric surface roughness}, url = {http://hydra.physics.muni.cz/~franta/bib/PTBF34_123.html}, year = {1998} }
TY - JOUR ID - 206012 AU - Ohlídal, Ivan - Franta, Daniel - Ohlídal, Miloslav - Vičar, Martin - Klapetek, Petr PY - 1998 TI - Comparison of AFM and optical methods at measuring nanometric surface roughness PB - Physikalisch-Technische Bundesanstalt CY - Braunschweig, SRN SN - 3897012804 UR - http://hydra.physics.muni.cz/~franta/bib/PTBF34_123.html N2 - In this contribution a comparison of the values of basic quantities characterizing random nanometric surface roughness determined by AFM and optical methods is presented. ER -
OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL, Martin VIČAR a Petr KLAPETEK. Comparison of AFM and optical methods at measuring nanometric surface roughness. In \textit{Proceedings of the 3th Seminar on Quantitative Microscopy}. Braunschweig, SRN: Physikalisch-Technische Bundesanstalt, 1998, s.~123-129. ISBN~3-89701-280-4.
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