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@article{206015,
author = {Franta, Daniel and Ohlídal, Ivan},
article_location = {Amsterdam},
article_number = {1},
keywords = {Near-field optics; Speckle effect; Rough thin films},
language = {eng},
issn = {0030-4018},
journal = {Optics Communications},
title = {Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries},
url = {http://hydra.physics.muni.cz/~franta/bib/OC147_349.html},
volume = {147},
year = {1998}
}
TY - JOUR
ID - 206015
AU - Franta, Daniel - Ohlídal, Ivan
PY - 1998
TI - Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries
JF - Optics Communications
VL - 147
IS - 1
SP - 349
EP - 349
PB - Elsevier Science
SN - 00304018
KW - Near-field optics
KW - Speckle effect
KW - Rough thin films
UR - http://hydra.physics.muni.cz/~franta/bib/OC147_349.html
N2 - In this theoretical paper the basic statistical quantities of the light intensity above thin-film systems with randomly rough boundaries are studied in the near-field. This means that formulae for the mean intensity, standard deviation of the intensity, correlation function of the intensity and the speckle contrast are derived for the systems mentioned in the near-field. It is assumed that the boundaries of the systems are slightly rough, i.e. that the rms values of heights of the irregularities of the boundaries are much smaller than the wavelength of incident light. The Rayleigh-Rice approach is employed for deriving the formulae expressing the quantities specified. In conclusion a brief numerical analysis of the theoretical results is presented.
ER -
FRANTA, Daniel a Ivan OHLÍDAL. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries. \textit{Optics Communications}. Amsterdam: Elsevier Science, 1998, roč.~147, č.~1, s.~349-358. ISSN~0030-4018.
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