| NAVRÁTIL, Karel, Jan ŠIK, Josef HUMLÍČEK a S. NEŠPŮREK. Optical properties of thin films of poly(methyl-phenylsilylene). Optical Materials. Amsterdam: Elsevier, 1999, roč. 1999, č. 12, s. 105-113. ISSN 0925-3467. |
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@article{215731,
author = {Navrátil, Karel and Šik, Jan and Humlíček, Josef and Nešpůrek, S.},
article_location = {Amsterdam},
article_number = {12},
language = {eng},
issn = {0925-3467},
journal = {Optical Materials},
title = {Optical properties of thin films of poly(methyl-phenylsilylene)},
volume = {1999},
year = {1999}
}
TY - JOUR
ID - 215731
AU - Navrátil, Karel - Šik, Jan - Humlíček, Josef - Nešpůrek, S.
PY - 1999
TI - Optical properties of thin films of poly(methyl-phenylsilylene)
JF - Optical Materials
VL - 1999
IS - 12
SP - 105
EP - 105
PB - Elsevier
SN - 09253467
N2 - We report the results of optical studies of thin films of poly(methyl-phenylsilylene) prepared on single-crystalline silicon and fused quartz substrates using the casting and spin coating technology. From near-normal incidence reflectance, we have determined the spectral dependence of the complex dielectric function and the complex refractive index in the energy interval from 1 to 7 eV.
ER -
NAVRÁTIL, Karel, Jan ŠIK, Josef HUMLÍČEK a S. NEŠPŮREK. Optical properties of thin films of poly(methyl-phenylsilylene). \textit{Optical Materials}. Amsterdam: Elsevier, 1999, roč.~1999, č.~12, s.~105-113. ISSN~0925-3467.
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