Scanning Probe Microscopy controller with advanced sampling support

VALTR, Miroslav, Petr KLAPETEK, Jan MARTINEK, Ondrej NOVOTNY, Zdenek JELINEK, Vaclav HORTVIK a David NECAS. Scanning Probe Microscopy controller with advanced sampling support. HardwareX. AMSTERDAM: Elsevier, 2023, roč. 15, 11 s. Dostupné z: https://dx.doi.org/10.1016/j.ohx.2023.e00451.

Základní údaje

Originální název

Scanning Probe Microscopy controller with advanced sampling support

Autoři

VALTR, Miroslav, Petr KLAPETEK, Jan MARTINEK, Ondrej NOVOTNY, Zdenek JELINEK, Vaclav HORTVIK a David NECAS

Vydání

HardwareX, AMSTERDAM, Elsevier, 2023

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Další údaje

Typ výsledku

Článek v odborném periodiku

Utajení

není předmětem státního či obchodního tajemství

DOI

http://dx.doi.org/10.1016/j.ohx.2023.e00451

UT WoS

001048214300001

Klíčová slova anglicky

Scanning probe microscopy; Adaptive sampling; Field programmable gate array

Příznaky

Mezinárodní význam, Recenzováno

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Anotace

V originále

A low-cost Digital Signal Processor (DSP) unit for advanced Scanning Probe Microscopy measurements is presented. It is based on Red Pitaya board and custom built electronic boards with additional high bit depth AD and DA converters. By providing all the necessary information (position and time) with each data point collected it can be used for any scan path, using either existing libraries for scan path generation or creating adaptive scan paths using Lua scripting interface. The DSP is also capable of performing statistical calculations, that can be used for decision making during scan or for the scan path optimisation on the DSP level.& COPY; 2023 The Author(s). Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).