Detailed Information on Publication Record
2001
Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires
HOLY, V., T. ROCH, J. STANGL and G. BAUERBasic information
Original name
Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires
Authors
HOLY, V., T. ROCH, J. STANGL and G. BAUER
Edition
Phys. Rev. B, USA, The American Phys. Society, 2001, 0163-1829
Other information
Language
English
Type of outcome
Článek v odborném periodiku
Field of Study
10302 Condensed matter physics
Country of publisher
Czech Republic
Confidentiality degree
není předmětem státního či obchodního tajemství
Impact factor
Impact factor: 3.070
RIV identification code
RIV/00216224:14310/01:00005200
Organization unit
Faculty of Science
UT WoS
000168937200065
Keywords in English
KINETIC GROWTH INSTABILITIES; VICINAL SI(001) SURFACES; STEPPED INTERFACES; GE ISLANDS; MULTILAYERS; DIFFRACTION; SI(113); STRAIN
Tags
Změněno: 16/1/2002 08:27, prof. RNDr. Václav Holý, CSc.
Abstract
V originále
The structure of self-organized quantum wires buried at the interfaces of a SiGe/Si multilayer is investigated by grazing incidence small-angle x-ray scattering. A nearly periodic distribution of wires, well described by a short-range ordering model, gives rise to intensity satellite maxima in reciprocal space. The shape of the wire cross section is determined from the heights of these intensity maxima, and the analysis reveals that the conventional step-bunching model is not sufficient to explain the wire shape.
Links
| GA202/00/0354, research and development project |
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