HOLY, V., T. ROCH, J. STANGL and G. BAUER. Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires. Phys. Rev. B. USA: The American Phys. Society, 2001, vol. 63, No 20, p. 5318-5327. ISSN 0163-1829. |
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@article{385311, author = {Holy, V. and Roch, T. and Stangl, J. and Bauer, G.}, article_location = {USA}, article_number = {20}, keywords = {KINETIC GROWTH INSTABILITIES; VICINAL SI(001) SURFACES; STEPPED INTERFACES; GE ISLANDS; MULTILAYERS; DIFFRACTION; SI(113); STRAIN}, language = {eng}, issn = {0163-1829}, journal = {Phys. Rev. B}, title = {Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires}, volume = {63}, year = {2001} }
TY - JOUR ID - 385311 AU - Holy, V. - Roch, T. - Stangl, J. - Bauer, G. PY - 2001 TI - Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires JF - Phys. Rev. B VL - 63 IS - 20 SP - 5318 EP - 5318 PB - The American Phys. Society SN - 01631829 KW - KINETIC GROWTH INSTABILITIES KW - VICINAL SI(001) SURFACES KW - STEPPED INTERFACES KW - GE ISLANDS KW - MULTILAYERS KW - DIFFRACTION KW - SI(113) KW - STRAIN N2 - The structure of self-organized quantum wires buried at the interfaces of a SiGe/Si multilayer is investigated by grazing incidence small-angle x-ray scattering. A nearly periodic distribution of wires, well described by a short-range ordering model, gives rise to intensity satellite maxima in reciprocal space. The shape of the wire cross section is determined from the heights of these intensity maxima, and the analysis reveals that the conventional step-bunching model is not sufficient to explain the wire shape. ER -
HOLY, V., T. ROCH, J. STANGL and G. BAUER. Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires. \textit{Phys. Rev. B}. USA: The American Phys. Society, 2001, vol.~63, No~20, p.~5318-5327. ISSN~0163-1829.
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