Complete Optical Analysis of Amorphous As-S Chalcogenide Thin
Films by the Combined Spectrophotometric Method

J 2001

Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method

OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ, Karel NAVRÁTIL et. al.

Základní údaje

Originální název

Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method

Autoři

OHLÍDAL, Ivan (203 Česká republika, garant), Daniel FRANTA (203 Česká republika), Miroslav FRUMAR, Jaroslav JEDELSKÝ a Karel NAVRÁTIL (203 Česká republika)

Vydání

Journal of Optoelectronics and Advanced Materials, Bucharest, INOE & INFM, 2001, 1454-4164

Další údaje

Jazyk

angličtina

Typ výsledku

Článek v odborném periodiku

Obor

10302 Condensed matter physics

Stát vydavatele

Rumunsko

Utajení

není předmětem státního či obchodního tajemství

Odkazy

URL

Impakt faktor

Impact factor: 0.274

Kód RIV

RIV/00216224:14310/01:00005240

Organizační jednotka

Přírodovědecká fakulta

UT WoS

000172819600009

Klíčová slova anglicky

As-S chalcogenide films; Combined spectrophotometric method; Amorphous materials; Optical constants

Štítky

Amorphous materials, As-S chalcogenide films, Combined spectrophotometric method, optical constants

Příznaky

Mezinárodní význam

Změněno: 13. 2. 2007 16:35, doc. RNDr. Karel Navrátil, CSc.

Anotace

V originále

In this paper a combined spectrophotometric method is used to analyzed As-S chalcogenide thin films. This method is based on the simultaneous interpretation of experimental data corresponding to the reflectance from the ambient side, reflectance from the substrate side and transmittance of the chalcogenide films deposited onto the glass substrate. It is shown that this method is usable for the optical characterization of the chalcogenide films even when these films exhibit an inhomogeneity formed by a refractive index profile. Within this method our dispersion model of the optical constants of amorphous materials is used. This means that the values of the dispersion parameters determining the spectral dependences of the optical constants of the As-S chalcogenide material are evaluated. In the paper the advantages of the combined method mentioned are discussed from the practical point of view.

Návaznosti

GA203/00/0085, projekt VaV

Název: Optické vlastnosti skel a amorfních tenkých vrstev sulfidů a selenidů

Investor: Grantová agentura ČR, Optické vlastnosti skel a amorfních tenkých vrstev sulfidů a selenidů

MSM 143100002, záměr

Název: Fyzikální vlastnosti nových materiálů a vrstevnatých struktur

Investor: Ministerstvo školství, mládeže a tělovýchovy ČR, Fyzikální vlastnosti nových materiálů a vrstevnatých struktur

Citovat

OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ a Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2001, roč. 3, č. 4, s. 873-878. ISSN 1454-4164.

@article{387372,
   author = {Ohlídal, Ivan and Franta, Daniel and Frumar, Miroslav and Jedelský, Jaroslav and Navrátil, Karel},
   article_location = {Bucharest},
   article_number = {4},
   keywords = {As-S chalcogenide films; Combined spectrophotometric method; Amorphous materials; Optical constants},
   language = {eng},
   issn = {1454-4164},
   journal = {Journal of Optoelectronics and Advanced Materials},
   title = {Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method},
   url = {http://hydra.physics.muni.cz/~franta/bib/JOAM3_873.html},
   volume = {3},
   year = {2001}
}

TY  - JOUR
ID  - 387372
AU  - Ohlídal, Ivan - Franta, Daniel - Frumar, Miroslav - Jedelský, Jaroslav - Navrátil, Karel
PY  - 2001
TI  - Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method
JF  - Journal of Optoelectronics and Advanced Materials
VL  - 3
IS  - 4
SP  - 873
EP  - 873
PB  - INOE & INFM
SN  - 14544164
KW  - As-S chalcogenide films
KW  - Combined spectrophotometric method
KW  - Amorphous materials
KW  - Optical constants
UR  - http://hydra.physics.muni.cz/~franta/bib/JOAM3_873.html
N2  - In this paper a combined spectrophotometric method is used to analyzed As-S chalcogenide thin films. This method is based on the simultaneous interpretation of experimental data corresponding to the reflectance from the ambient side, reflectance from the substrate side and transmittance of the chalcogenide films deposited onto the glass substrate. It is shown that this method is usable for the optical characterization of the chalcogenide films even when these films exhibit an inhomogeneity formed by a refractive index profile. Within this method our dispersion model of the optical constants of amorphous materials is used. This means that the values of the dispersion parameters determining the spectral dependences of the optical constants of the As-S chalcogenide material are evaluated. In the paper the advantages of the combined method mentioned are discussed from the practical point of view.
ER  -

OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ a Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. \textit{Journal of Optoelectronics and Advanced Materials}. Bucharest: INOE \&{} INFM, 2001, roč.~3, č.~4, s.~873-878. ISSN~1454-4164.

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