KAGANER, V.M., B. JENICHEN, G. PARIS, K.H. PLOOG, O. KONOVALOV, Petr MIKULÍK a S. ARAI. Strain in buried quantum wires: Analytical calculations and x-ray diffraction study. Phys. Rev. B. USA: The American Phys. Society, 2002, roč. 2002, č. 66, s. 035310-35316. ISSN 0163-1829. |
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@article{407470, author = {Kaganer, V.M. and Jenichen, B. and Paris, G. and Ploog, K.H. and Konovalov, O. and Mikulík, Petr and Arai, S.}, article_location = {USA}, article_number = {66}, keywords = {x-ray diffraction; quantum wires; x-ray}, language = {eng}, issn = {0163-1829}, journal = {Phys. Rev. B}, title = {Strain in buried quantum wires: Analytical calculations and x-ray diffraction study}, url = {http://www.sci.muni.cz/~mikulik/Publications.html#KaganerJenichenParisPKMA-PRB-2002}, volume = {2002}, year = {2002} }
TY - JOUR ID - 407470 AU - Kaganer, V.M. - Jenichen, B. - Paris, G. - Ploog, K.H. - Konovalov, O. - Mikulík, Petr - Arai, S. PY - 2002 TI - Strain in buried quantum wires: Analytical calculations and x-ray diffraction study JF - Phys. Rev. B VL - 2002 IS - 66 SP - 035310 EP - 035310 PB - The American Phys. Society SN - 01631829 KW - x-ray diffraction KW - quantum wires KW - x-ray UR - http://www.sci.muni.cz/~mikulik/Publications.html#KaganerJenichenParisPKMA-PRB-2002 N2 - The displacement field in and around periodically arranged quantum wires embedded in a crystalline matrix is calculated analytically for an arbitrary finite thickness of the cover layer. A good agreement is obtained between measured x-ray-diffraction peaks of a wire structure and kinematical calculations with the displace-ment field derived in the paper. The strain and quantum size effects on the photoluminescence line shift are found to be comparable, due to small width ~35 nm of the wires. ER -
KAGANER, V.M., B. JENICHEN, G. PARIS, K.H. PLOOG, O. KONOVALOV, Petr MIKULÍK a S. ARAI. Strain in buried quantum wires: Analytical calculations and x-ray diffraction study. \textit{Phys. Rev. B}. USA: The American Phys. Society, 2002, roč.~2002, č.~66, s.~035310-35316. ISSN~0163-1829.
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