| KAGANER, V.M., B. JENICHEN, G. PARIS, K.H. PLOOG, O. KONOVALOV, Petr MIKULÍK and S. ARAI. Strain in buried quantum wires: Analytical calculations and x-ray diffraction study. Phys. Rev. B. USA: The American Phys. Society, 2002, vol. 2002, No 66, p. 035310-35316. ISSN 0163-1829. |
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@article{407470,
author = {Kaganer, V.M. and Jenichen, B. and Paris, G. and Ploog, K.H. and Konovalov, O. and Mikulík, Petr and Arai, S.},
article_location = {USA},
article_number = {66},
keywords = {x-ray diffraction; quantum wires; x-ray},
language = {eng},
issn = {0163-1829},
journal = {Phys. Rev. B},
title = {Strain in buried quantum wires: Analytical calculations and x-ray diffraction study},
url = {http://www.sci.muni.cz/~mikulik/Publications.html#KaganerJenichenParisPKMA-PRB-2002},
volume = {2002},
year = {2002}
}
TY - JOUR
ID - 407470
AU - Kaganer, V.M. - Jenichen, B. - Paris, G. - Ploog, K.H. - Konovalov, O. - Mikulík, Petr - Arai, S.
PY - 2002
TI - Strain in buried quantum wires: Analytical calculations and x-ray diffraction study
JF - Phys. Rev. B
VL - 2002
IS - 66
SP - 035310
EP - 035310
PB - The American Phys. Society
SN - 01631829
KW - x-ray diffraction
KW - quantum wires
KW - x-ray
UR - http://www.sci.muni.cz/~mikulik/Publications.html#KaganerJenichenParisPKMA-PRB-2002
N2 - The displacement field in and around periodically arranged quantum wires embedded in a crystalline matrix is calculated analytically for an arbitrary finite thickness of the cover layer. A good agreement is obtained between measured x-ray-diffraction peaks of a wire structure and kinematical calculations with the displace-ment field derived in the paper. The strain and quantum size effects on the photoluminescence line shift are found to be comparable, due to small width ~35 nm of the wires.
ER -
KAGANER, V.M., B. JENICHEN, G. PARIS, K.H. PLOOG, O. KONOVALOV, Petr MIKULÍK and S. ARAI. Strain in buried quantum wires: Analytical calculations and x-ray diffraction study. \textit{Phys. Rev. B}. USA: The American Phys. Society, 2002, vol.~2002, No~66, p.~035310-35316. ISSN~0163-1829.
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