Optical constants of ZnTe and ZnSe epitaxial thin films

J 2003

Optical constants of ZnTe and ZnSe epitaxial thin films

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI et. al.

Základní údaje

Originální název

Optical constants of ZnTe and ZnSe epitaxial thin films

Autoři

FRANTA, Daniel (203 Česká republika, garant), Ivan OHLÍDAL (203 Česká republika), Petr KLAPETEK (203 Česká republika), Alberto MONTAIGNE-RAMIL (192 Kuba), Alberta BONANNI (380 Itálie), David STIFTER (40 Rakousko) a Helmut SITTER (40 Rakousko)

Vydání

Acta Physica Slovaca, Bratislava, Institute of Physics SAS, 2003, 0323-0465

Další údaje

Jazyk

angličtina

Typ výsledku

Článek v odborném periodiku

Obor

10302 Condensed matter physics

Stát vydavatele

Slovensko

Utajení

není předmětem státního či obchodního tajemství

Odkazy

URL

Impakt faktor

Impact factor: 0.579

Kód RIV

RIV/00216224:14310/03:00008102

Organizační jednotka

Přírodovědecká fakulta

UT WoS

000182451100002

Klíčová slova anglicky

SPECTROSCOPIC ELLIPSOMETRY; MATRIX FORMALISM; CARBON-FILMS; MULTISAMPLE; GAAS

Štítky

CARBON-FILMS, GAAS, matrix formalism, MULTISAMPLE, spectroscopic ellipsometry

Změněno: 25. 12. 2003 01:24, Mgr. Daniel Franta, Ph.D.

Anotace

V originále

In this paper the spectral dependences of the optical constants, i.e. refractive index and extinction coefficient, are presented within the spectral region 220-850 nm. For determining these spectral dependences a multi-sample modification of the combined optical method based on a simultaneous interpretation of experimental data corresponding to variable angle spectro-scopic ellipsometry and near-normal spectroscopic reflectometry is used. Further, physical models and an iterative procedure enabling us to determine the spectral dependences of the optical constants of both the epitaxial films are described in detail. The spectral dependences of the optical constants are introduced in the forms of curves and tables.

Návaznosti

GA202/01/1110, projekt VaV

Název: Optické a mechanické vlastnosti tenkých vrstev DLC:Si připravených PECVD metodou

Investor: Grantová agentura ČR, Optické a mechanické vlastnosti tenkých vrstev DLC:Si připravených PECVD metodou

Citovat

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Optical constants of ZnTe and ZnSe epitaxial thin films. Acta Physica Slovaca. Bratislava: Institute of Physics SAS, 2003, roč. 53, č. 2, s. 95-104. ISSN 0323-0465.

@article{487588,
   author = {Franta, Daniel and Ohlídal, Ivan and Klapetek, Petr and MontaigneandRamil, Alberto and Bonanni, Alberta and Stifter, David and Sitter, Helmut},
   article_location = {Bratislava},
   article_number = {2},
   keywords = {SPECTROSCOPIC ELLIPSOMETRY; MATRIX FORMALISM; CARBON-FILMS; MULTISAMPLE; GAAS},
   language = {eng},
   issn = {0323-0465},
   journal = {Acta Physica Slovaca},
   title = {Optical constants of ZnTe and ZnSe epitaxial thin films},
   url = {http://hydra.physics.muni.cz/~franta/bib/APS53_95.html},
   volume = {53},
   year = {2003}
}

TY  - JOUR
ID  - 487588
AU  - Franta, Daniel - Ohlídal, Ivan - Klapetek, Petr - Montaigne-Ramil, Alberto - Bonanni, Alberta - Stifter, David - Sitter, Helmut
PY  - 2003
TI  - Optical constants of ZnTe and ZnSe epitaxial thin films
JF  - Acta Physica Slovaca
VL  - 53
IS  - 2
SP  - 95-104
EP  - 95-104
PB  - Institute of Physics SAS
SN  - 03230465
KW  - SPECTROSCOPIC ELLIPSOMETRY
KW  - MATRIX FORMALISM
KW  - CARBON-FILMS
KW  - MULTISAMPLE
KW  - GAAS
UR  - http://hydra.physics.muni.cz/~franta/bib/APS53_95.html
N2  - In this paper the spectral dependences of the optical constants, i.e. refractive index and extinction coefficient, are presented within the spectral region 220-850 nm. For determining these spectral dependences a multi-sample modification of the combined optical method based on a simultaneous interpretation of experimental data corresponding to variable angle spectro-scopic ellipsometry and near-normal spectroscopic reflectometry is used. Further, physical models and an iterative procedure enabling us to determine the spectral dependences of the optical constants of both the epitaxial films are described in detail. The spectral dependences of the optical constants are introduced in the forms of curves and tables.
ER  -

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Optical constants of ZnTe and ZnSe epitaxial thin films. \textit{Acta Physica Slovaca}. Bratislava: Institute of Physics SAS, 2003, roč.~53, č.~2, s.~95-104. ISSN~0323-0465.

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