| KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial thin films. Japanese Journal of Applied Physics. Tokyo: Institute of Pure and Applied Physics, 2003, roč. 42, 7B, s. 4706-4709, 5 s. ISSN 0021-4922. |
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@article{490021,
author = {Klapetek, Petr and Ohlídal, Ivan and MontaigneandRamil, Alberto and Bonanni, Alberta and Stifter, David and Sitter, Helmut},
article_location = {Tokyo},
article_number = {7B},
keywords = {ZnTe epitaxial films; AFM analysis; faceted boundaries},
language = {eng},
issn = {0021-4922},
journal = {Japanese Journal of Applied Physics},
title = {Atomic force microscopy characterization of ZnTe epitaxial thin films},
volume = {42},
year = {2003}
}
TY - JOUR
ID - 490021
AU - Klapetek, Petr - Ohlídal, Ivan - Montaigne-Ramil, Alberto - Bonanni, Alberta - Stifter, David - Sitter, Helmut
PY - 2003
TI - Atomic force microscopy characterization of ZnTe epitaxial thin films
JF - Japanese Journal of Applied Physics
VL - 42
IS - 7B
SP - 4706-4709
EP - 4706-4709
PB - Institute of Pure and Applied Physics
SN - 00214922
KW - ZnTe epitaxial films
KW - AFM analysis
KW - faceted boundaries
N2 - In this paper, results concerning atomic force microscopy studies of the upper bounaries of ZnTe epitaxial thin films prepared by molecular beam epitaxy onto gallium arsenide single crystal substrates are presented. It is sohw that the upper boundaries exhibit faceted structure which is described by means of statistical analysis.
ER -
KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial thin films. \textit{Japanese Journal of Applied Physics}. Tokyo: Institute of Pure and Applied Physics, 2003, roč.~42, 7B, s.~4706-4709, 5 s. ISSN~0021-4922.
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