Výpis publikací

2003

1. Atomic force microscopy characterization of ZnTe epitaxial thin films

   KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial thin films. Japanese Journal of Applied Physics. Tokyo: Institute of Pure and Applied Physics, 2003, roč. 42, 7B, s. 4706-4709, 5 s. ISSN 0021-4922.

   Podrobněji: https://is.muni.cz/publication/490021/cs