HUMLÍČEK, Josef and Christian BERNHARD. Diffraction effects in infrared ellipsometry of conducting samples. Thin Solid Films. Oxford: Elsevier, 2004, 455-456, No 1, p. 177-182. ISSN 0040-6090.
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Basic information
Original name Diffraction effects in infrared ellipsometry of conducting samples
Name in Czech Difrakční efekty v infračervené elipsometrii vodivých vzorků
Authors HUMLÍČEK, Josef (203 Czech Republic, guarantor) and Christian BERNHARD (276 Germany).
Edition Thin Solid Films, Oxford, Elsevier, 2004, 0040-6090.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher United Kingdom of Great Britain and Northern Ireland
Confidentiality degree is not subject to a state or trade secret
Impact factor Impact factor: 1.647
RIV identification code RIV/00216224:14310/04:00021209
Organization unit Faculty of Science
UT WoS 000221690000030
Keywords in English Infrared ellipsometry; Diffraction; Metals
Tags diffraction, infrared ellipsometry, metals
Tags International impact, Reviewed
Changed by Changed by: prof. RNDr. Josef Humlíček, CSc., učo 307. Changed: 9/2/2007 14:21.
Abstract
We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper.
Abstract (in Czech)
We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper.
Links
MSM 143100002, plan (intention)Name: Fyzikální vlastnosti nových materiálů a vrstevnatých struktur
Investor: Ministry of Education, Youth and Sports of the CR, Physical properties of new materials and layered structures
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