| FIKAR, Jan, Christophe COUPEAU, Tomáš KRUML a Joel BONNEVILLE. Experimental study of Ni3Al slip traces by atomic force microscopy: an evidence of mobile dislocation exhaustion. Materials Science and Engineering A. Netherland, 2004, roč. 387-389, č. 1, s. 926-930. ISSN 0921-5093. |
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@article{567036,
author = {Fikar, Jan and Coupeau, Christophe and Kruml, Tomáš and Bonneville, Joel},
article_location = {Netherland},
article_number = {1},
keywords = {AFM; slip traces; cross-slip; Ni3Al; single crystal},
language = {eng},
issn = {0921-5093},
journal = {Materials Science and Engineering A},
title = {Experimental study of Ni3Al slip traces by atomic force microscopy: an evidence of mobile dislocation exhaustion},
volume = {387-389},
year = {2004}
}
TY - JOUR
ID - 567036
AU - Fikar, Jan - Coupeau, Christophe - Kruml, Tomáš - Bonneville, Joel
PY - 2004
TI - Experimental study of Ni3Al slip traces by atomic force microscopy: an evidence of mobile dislocation exhaustion
JF - Materials Science and Engineering A
VL - 387-389
IS - 1
SP - 926-930
EP - 926-930
SN - 09215093
KW - AFM
KW - slip traces
KW - cross-slip
KW - Ni3Al
KW - single crystal
N2 - Slip markings produced on the surfaces of Ni-3(Al, Ta) single crystals, plastically deformed at various temperatures in the flow stress anomaly domain, were examined by atomic force microscopy (AFM). A dominant feature is that for all investigated temperatures, the slip traces are rectilinear and correspond to the primary octahedral glide plane. In addition, their lengths drastically decrease when the temperature is raised. This latter result is interpreted as a strong increase of the exhaustion rate of mobile dislocations with increasing temperatures. The consequences of these results in the understanding of Ni3Al flow stress anomaly are discussed.
ER -
FIKAR, Jan, Christophe COUPEAU, Tomáš KRUML a Joel BONNEVILLE. Experimental study of Ni3Al slip traces by atomic force microscopy: an evidence of mobile dislocation exhaustion. \textit{Materials Science and Engineering A}. Netherland, 2004, roč.~387-389, č.~1, s.~926-930. ISSN~0921-5093.
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