| HARTMANNOVÁ, Mária, Martin JERGEL, Vladislav NAVRÁTIL, Karel NAVRÁTIL, Katarina GMUCOVÁ, F.C. GANDARILLA, Jan ZEMEK, Stefan CHROMIK a Frantiaek KUNDRACIK. Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets. In Acta Physica Slovaca. I. Bratislava: Institute of Physics, SAS, Bratislava, Slovakia, 2005, s. 247-259. ISBN 5-94691-216-X. |
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@inproceedings{573078,
author = {Hartmannová, Mária and Jergel, Martin and Navrátil, Vladislav and Navrátil, Karel and Gmucová, Katarina and Gandarilla, F.C. and Zemek, Jan and Chromik, Stefan and Kundracik, Frantiaek},
address = {Bratislava},
booktitle = {Acta Physica Slovaca},
edition = {I.},
keywords = {Yttria stabilized zirconia; thin films; electrical conductivity; microhardness; refractive index; relative permitivity},
language = {eng},
location = {Bratislava},
isbn = {5-94691-216-X},
pages = {247-259},
publisher = {Institute of Physics, SAS, Bratislava, Slovakia},
title = {Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets},
year = {2005}
}
TY - JOUR
ID - 573078
AU - Hartmannová, Mária - Jergel, Martin - Navrátil, Vladislav - Navrátil, Karel - Gmucová, Katarina - Gandarilla, F.C. - Zemek, Jan - Chromik, Stefan - Kundracik, Frantiaek
PY - 2005
TI - Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets
PB - Institute of Physics, SAS, Bratislava, Slovakia
CY - Bratislava
SN - 594691216X
KW - Yttria stabilized zirconia
KW - thin films
KW - electrical conductivity
KW - microhardness
KW - refractive index
KW - relative permitivity
N2 - The films under study were deposited by e-beam evaporation on yttria-stabilized zirconia crystalline samples on the n-doped Si (111) substrate at 750 C. The electrical conductivity and the activation energy as the function of the yttria content indicated the influence of isolated oxygen ion vacancies as well as the associated point defects.The measured microhardness data as well as a high refractive index render from YSZ a promising material for protective coatings and optical applications respectively.
ER -
HARTMANNOVÁ, Mária, Martin JERGEL, Vladislav NAVRÁTIL, Karel NAVRÁTIL, Katarina GMUCOVÁ, F.C. GANDARILLA, Jan ZEMEK, Stefan CHROMIK a Frantiaek KUNDRACIK. Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets. In \textit{Acta Physica Slovaca}. I. Bratislava: Institute of Physics, SAS, Bratislava, Slovakia, 2005, s.~247-259. ISBN~5-94691-216-X.
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