FRANTA, Daniel, Beatrice NEGULESCU, Luc THOMAS, Pierre Richard DAHOO, Marcel GUYOT, Ivan OHLÍDAL, Jan MISTRÍK a Tomuo YAMAGUCHI. Optical properties of NiO thin films prepared by pulsed laser deposition technique. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 426-430. ISSN 0169-4332. |
Další formáty:
BibTeX
LaTeX
RIS
@article{621484, author = {Franta, Daniel and Negulescu, Beatrice and Thomas, Luc and Dahoo, Pierre Richard and Guyot, Marcel and Ohlídal, Ivan and Mistrík, Jan and Yamaguchi, Tomuo}, article_location = {USA}, article_number = {1-4}, keywords = {NiO films; Optical constants; Ellipsometry; Reflectometry}, language = {eng}, issn = {0169-4332}, journal = {Applied Surface Science}, title = {Optical properties of NiO thin films prepared by pulsed laser deposition technique}, url = {http://hydra.physics.muni.cz/~franta/bib/ASS244_426.html}, volume = {244}, year = {2005} }
TY - JOUR ID - 621484 AU - Franta, Daniel - Negulescu, Beatrice - Thomas, Luc - Dahoo, Pierre Richard - Guyot, Marcel - Ohlídal, Ivan - Mistrík, Jan - Yamaguchi, Tomuo PY - 2005 TI - Optical properties of NiO thin films prepared by pulsed laser deposition technique JF - Applied Surface Science VL - 244 IS - 1-4 SP - 426-430 EP - 426-430 PB - ELSEVIER (NORTH-HOLLAND) SN - 01694332 KW - NiO films KW - Optical constants KW - Ellipsometry KW - Reflectometry UR - http://hydra.physics.muni.cz/~franta/bib/ASS244_426.html N2 - In this paper the optical characterization of the NiO thin films prepared by pulsed laser deposition technique onto the quartz substrate were performed using multi-sample modification of the combined optical method based on measuring and interpreting the experimental data obtained by variable angle spectroscopic ellipsometry and spectrophotometry in reflected and transmitted light. A new dispersion model of the optical constants of the NiO films was also used. This dispersion model was based on parameterizing of the joint density of states together with the Gaussian broadening. The defects consiting in boundary roughness and refractive index profile were taken into account in optical characterization of the NiO films too. The spectral dependences of the optical constants together with the parameters characterizing the defects of these films were determined. ER -
FRANTA, Daniel, Beatrice NEGULESCU, Luc THOMAS, Pierre Richard DAHOO, Marcel GUYOT, Ivan OHLÍDAL, Jan MISTRÍK a Tomuo YAMAGUCHI. Optical properties of NiO thin films prepared by pulsed laser deposition technique. \textit{Applied Surface Science}. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč.~244, 1-4, s.~426-430. ISSN~0169-4332.
|