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@inproceedings{630345, author = {Klapetek, Petr and Ohlídal, Ivan and Bílek, Jindřich}, address = {Weinheim 2005}, booktitle = {Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro-and Nanometer Range}, keywords = {AFM}, language = {eng}, location = {Weinheim 2005}, isbn = {3-527-40502-X}, pages = {452-462}, publisher = {Wiley-VCH Verlag GmbH and Co. KGaA}, title = {Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces}, year = {2005} }
TY - JOUR ID - 630345 AU - Klapetek, Petr - Ohlídal, Ivan - Bílek, Jindřich PY - 2005 TI - Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces PB - Wiley-VCH Verlag GmbH and Co. KGaA CY - Weinheim 2005 SN - 352740502X KW - AFM N2 - In this chapter several fractal and multi-fractal analysis methods are studied to characterize their efficiency on evaluating fractal properties of randomly rough surfaces. Moreover, results concerning estimation of atomic force microscopy (AFM) tip influence on evaluation of fractal properties of rough surfaces are presented. Randomly rough surfaces are simulated by means of spectral synthesis method and AFM tip convolution with the simulated surface is numerically performed. The results of the fractal and multi-fractal analysis before and after tip convolution are compared. It is shown that significant discrepancies can be observed between different fractal analysis methods applied on the same simulated data. This fact is true in particular if the data are convolved with AFM tip having relatively large apex radius in comparison to objects forming surface roughness ER -
KLAPETEK, Petr, Ivan OHLÍDAL a Jindřich BÍLEK. Atomic Force Microscope Tip Influence on
the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough
Surafaces. In \textit{Nanoscale Calibration Standards and Methods: Dimensional and
Related Measurements in the Micro-and Nanometer Range}. Weinheim 2005: Wiley-VCH Verlag GmbH and Co. KGaA, 2005, s.~452-462. ISBN~3-527-40502-X.
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