| BIRKHOLZ, Mario. Thin film analysis by X-ray scattering. Edited by Paul F. Fewster - Christoph Genzel. Weinheim: Wiley-VCH, 2006, xxii, 356. ISBN 3527310525. |
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| Basic information | |
|---|---|
| Original name | Thin film analysis by X-ray scattering |
| Authors | BIRKHOLZ, Mario. Edited by Paul F. Fewster - Christoph Genzel. |
| Edition | Weinheim, xxii, 356, 2006. |
| Publisher | Wiley-VCH |
| Other information | |
|---|---|
| ISBN | 3527310525 |
| Changed by | The record has been imported from the library system. Changed: 8/8/2022 13:23. |
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