J 2006

1.3 mum emission from InAs/GaAs quantum dots

KULDOVÁ, Karla, Vlastimil KŘÁPEK, Alice HOSPODKOVÁ, Jiří OSWALD, Jiří PANGRÁC et. al.

Basic information

Original name

1.3 mum emission from InAs/GaAs quantum dots

Name in Czech

Emise na 1.3 mikrometru z InAs/GaAs kvantových teček

Authors

KULDOVÁ, Karla (203 Czech Republic), Vlastimil KŘÁPEK (203 Czech Republic, guarantor), Alice HOSPODKOVÁ (203 Czech Republic), Jiří OSWALD (203 Czech Republic), Jiří PANGRÁC (203 Czech Republic), Karel MELICHAR (203 Czech Republic), Eduard HULICIUS (203 Czech Republic), Marek POTEMSKI (250 France) and Josef HUMLÍČEK (203 Czech Republic)

Edition

physica status solidi (c), Weinheim, WILEY-VCH Verlag GmbH, 2006, 1610-1642

Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10302 Condensed matter physics

Country of publisher

Netherlands

Confidentiality degree

není předmětem státního či obchodního tajemství

RIV identification code

RIV/00216224:14310/06:00018456

Organization unit

Faculty of Science

Keywords in English

quantum dots; InAs/GaAs; magnetophotoluminescence

Tags

International impact, Reviewed
Změněno: 9/4/2010 15:48, prof. RNDr. Josef Humlíček, CSc.

Abstract

V originále

We report here the results of our photoluminescence study of a series of single quantum dot layer structures containing InxGa1–xAs strain reducing layers with different In concentration (from 0 % to 29 %), prepared by low pressure metal organic vapour phase epitaxy. These structures display a strong red shift of photoluminescence maxima from 1.25 mum to 1.45 mum at 300 K with increased In content in the ternary layer. The origin of the observed transitions has been explained using magnetophotoluminescence measurements and photoluminescence measurements for different pumping intensities at low temperature. Optical transition energies were calculated using a simple single-band effective mass model with energydependent effective mass. Comparing the calculated and measured energies, we can determine the thickness of the wetting layer and the sizes of the dots.

In Czech

We report here the results of our photoluminescence study of a series of single quantum dot layer structures containing InxGa1–xAs strain reducing layers with different In concentration (from 0 % to 29 %), prepared by low pressure metal organic vapour phase epitaxy. These structures display a strong red shift of photoluminescence maxima from 1.25 mum to 1.45 mum at 300 K with increased In content in the ternary layer. The origin of the observed transitions has been explained using magnetophotoluminescence measurements and photoluminescence measurements for different pumping intensities at low temperature. Optical transition energies were calculated using a simple single-band effective mass model with energydependent effective mass. Comparing the calculated and measured energies, we can determine the thickness of the wetting layer and the sizes of the dots.

Links

GA202/06/0718, research and development project
Name: Inženýrství kvantových teček
Investor: Czech Science Foundation
KJB101630601, research and development project
Name: Morfologie kvantových teček a její vliv na elektronovou strukturu
Investor: Academy of Sciences of the Czech Republic
MSM0021622410, plan (intention)
Name: Fyzikální a chemické vlastnosti pokročilých materiálů a struktur
Investor: Ministry of Education, Youth and Sports of the CR, Physical and chemical properties of advanced materials and structures