MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Günther BAUER, Claudiu FALUB, Soichiro TSUJINO and Detlev GRÜTZMACHER. In-situ investigations of Si and Ge interdiffusion in Si cascade structures. Synchrotron Radiation in Natural Sciences. Warsaw: Polish Synchrotron Radiation Society, 2006, vol. 5, 1-2, p. 76. ISSN 1644-7190.
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Basic information
Original name In-situ investigations of Si and Ge interdiffusion in Si cascade structures
Name in Czech In-situ studie Si a Ge interdifuse v Si kaskádových strukturách
Authors MEDUŇA, Mojmír (203 Czech Republic, guarantor), Jiří NOVÁK (203 Czech Republic), Václav HOLÝ (203 Czech Republic), Günther BAUER (40 Austria), Claudiu FALUB (642 Romania), Soichiro TSUJINO (392 Japan) and Detlev GRÜTZMACHER (276 Germany).
Edition Synchrotron Radiation in Natural Sciences, Warsaw, Polish Synchrotron Radiation Society, 2006, 1644-7190.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher Poland
Confidentiality degree is not subject to a state or trade secret
RIV identification code RIV/00216224:14310/06:00016352
Organization unit Faculty of Science
Keywords in English x-ray reflectivity; multilayers; interdiffusion; SiGe
Tags Interdiffusion, multilayers, SiGe, x-ray reflectivity
Tags International impact
Changed by Changed by: Mgr. Mojmír Meduňa, Ph.D., učo 7898. Changed: 24/1/2007 14:21.
Abstract
We focus on investigation of temperature stability of simple strain symmetrized SiGe/Si multilayers designed similarly as the complicated quantum cascade structures with Ge content 30% and 80%. X-ray reflectivity and diffraction reciprocal space maps for all structures have been recorded at room temperature and during several isothermal annealing processes for temperatures ranging from 550 C up to 824 C.
Abstract (in Czech)
Zaměřujeme se na studium teplotní stabitlity jednoduchých deformačně symetrizovaných SiGe/Si multivrstev navrhnutých podobně tak jako komplikované kvantově kaskádové struktury s obsahem Ge 30% a 80%. Reciproké mapy rtg reflexe a difrakce všech struktur byly zaznamenány při pokojové teplotě a během isotermického žíhání pro teploty v rozsahu od 550 C do 824 C.
Links
GP202/05/P286, research and development projectName: Studium morfologie polovodičových multivrstev pomocí rtg rozptylu
Investor: Czech Science Foundation, Investigation of morphology of semiconductor multilayers using x-ray scattering
MSM0021622410, plan (intention)Name: Fyzikální a chemické vlastnosti pokročilých materiálů a struktur
Investor: Ministry of Education, Youth and Sports of the CR, Physical and chemical properties of advanced materials and structures
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