Publication Records

BANERJEE, Rupak, Jiří NOVÁK, Christian FRANK, Maria GIRLEANU, Olivier ERSEN, Martin BRINKMANN, Falk ANGER, Christian LORCH, Johannes DIETERLE, Alexander GERLACH, Jakub DRNEC, Sun YU and Frank SCHREIBER. Structure and Morphology of Organic Semiconductor-Nanoparticle Hybrids Prepared by Soft Deposition. JOURNAL OF PHYSICAL CHEMISTRY C. Washington D.C.: American Chemical Society, 2015, vol. 119, No 9, p. 5225-5237. ISSN 1932-7447. Available from: https://dx.doi.org/10.1021/acs.jpcc.5b00480.

MEDUŇA, Mojmír, Ondřej CAHA, Günther BAUER, Gregor MUSSLER and Detlev GRÜTZMACHER. Utilization of synchrotron radiation for in-situ diffusion studies. 2008.

MEDUŇA, Mojmír, Jiří NOVÁK, Günther BAUER, Václav HOLÝ, Claudiu FALUB, Soichiro TSUJINO and Detlev GRÜTZMACHER. Interdiffusion in SiGe alloys studied by x-rays. Materials Structure in Chemistry, Biology, Physics and Technology. Praha, 2007, vol. 14, No 2, p. 122-123. ISSN 1211-5894.

MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Günther BAUER, Claudiu FALUB, Soichiro TSUJINO and Detlev GRÜTZMACHER. In-situ investigations of Si and Ge interdiffusion in Si cascade structures. Synchrotron Radiation in Natural Sciences. Warsaw: Polish Synchrotron Radiation Society, 2006, vol. 5, 1-2, p. 76. ISSN 1644-7190.

AGNIHOTRI, Dileepa, V. E. ASADCHIKOV, Elza BONTEMPI, Chang-Hwan CHANG, Paolo COLOMBI, Laura E. DEPERO, Mark FARNWORTH, Toshiyuki FUJIMOTO, Alan GIBAUD, Matej JERGEL, D. Keith BOWEN, Michael KRUMREY, Alessio LAMPERTI, Tamzin A. LAFFORD, Richard J MATYI, T. MA, Mojmír MEDUŇA, Silvia MILITA, Kenji SAKURAI, Leonid SHABEL'NIKOV, S. SONI, Alexander ULYANENKOV, A. van der LEE and Claudia WIEMER. X-Ray Reflectivity measurements to evaluate thin films and multilayers thickness: preliminary results of the first world Round-Robin Test. In XTOP 2006 - 8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging. Karlsruhe: Forchungszentrum Karlsruhe, 2006, p. 75.

MEDUŇA, Mojmír, Jiří NOVÁK, Günther BAUER, Claudiu FALUB and Detlev GRÜTZMACHER. HIGH TEMPERATURE INVESTIGATION OF SiGe/Si-BASED CASCADE EMITTERS IN THE FAR-INFRARED. In XXXIV International School on the Physics of Semiconducting Compounds, Jaszowiec 2005. 2005.

MEDUŇA, Mojmír, Jiří NOVÁK, Claudiu FALUB, Gang CHEN, Günther BAUER, Soichiro TSUJINO, Detlev GRÜTZMACHER, Elisabeth MÜLLER, Yves CAMPIDELLI, Olivier KERMARREC, Daniel BENSAHEL and Norbert SCHELL. High temperature investigations of Si/SiGe based cascade structures using x-ray scattering methods. J. Phys. D: Appl. Phys. Bristol, UK: IOP Publishing, Ltd., 2005, vol. 38, 10A, p. A121-A125, 5 pp. ISSN 0022-3727.

POLOUČEK, Pavel, U. PIETSCH, T. GEUE, C. SYMIETZ and G. BREZESINSKI. X-ray reflectivity analysis of thin complex Langmuir-Blodgett films. Journal of physics D: Applied physics. Bristol, England: IOP Publishing Ltd., 2001, vol. 34, No 4, p. 450-458. ISSN 0022-3727.

JERGEL, M., Petr MIKULÍK, E. MAJKOVÁ, Š. LUBY, R. SENDERÁK, E. PINČÍK, M. BRUNEL, P. HUDEK, I. KOSTIČ and A. KONEČNÍKOVÁ. Structural characterization of a lamellar W/Si multilayer grating. J. Appl. Phys. USA: American Institute of Physics, 1999, vol. 85, No 2, p. 1225-1227. ISSN 0021-8979.

JERGEL, M., Petr MIKULÍK, E. MAJKOVÁ, Š. LUBY, R. SENDERÁK, E. PINČÍK, M. BRUNEL, I. KOSTIČ and A. KONEČNÍKOVÁ. Structural characterization of lamellar multilayer gratings by X-ray reflectivity and scanning electron microscopy. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 1999, vol. 32, No 9999, p. A220, 4 pp. ISSN 0022-3727.