| MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Claudiu FALUB, Günther BAUER a Detlev GRÜTZMACHER. IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SI CASCADE STRUCTURES. Materials Structure in Chemistry, Biology, Physics and Technology. Praha, 2006, roč. 13, č. 3, s. 161. ISSN 1211-5894. |
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@article{710342,
author = {Meduňa, Mojmír and Novák, Jiří and Holý, Václav and Falub, Claudiu and Bauer, Günther and Grützmacher, Detlev},
article_location = {Praha},
article_number = {3},
keywords = {x-ray diffraction; interdiffusion; SiGe},
language = {eng},
issn = {1211-5894},
journal = {Materials Structure in Chemistry, Biology, Physics and Technology},
title = {IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SI CASCADE STRUCTURES},
volume = {13},
year = {2006}
}
TY - JOUR
ID - 710342
AU - Meduňa, Mojmír - Novák, Jiří - Holý, Václav - Falub, Claudiu - Bauer, Günther - Grützmacher, Detlev
PY - 2006
TI - IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SI CASCADE STRUCTURES
JF - Materials Structure in Chemistry, Biology, Physics and Technology
VL - 13
IS - 3
SP - 161
EP - 161
SN - 12115894
KW - x-ray diffraction
KW - interdiffusion
KW - SiGe
N2 - We have studied series of strain symmetrized multiple quantum well structures grown on Si0.25Ge0.25 and Si0.5Ge0.5 pseudosubstrates. The Ge content in these structures was 30% and 80% with multilayer periods in the range from 6 to 13 nm. X-ray reflectivity and diffraction reciprocal space maps for all structures have been recorded at room temperature and during annealing.
ER -
MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Claudiu FALUB, Günther BAUER a Detlev GRÜTZMACHER. IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SI CASCADE STRUCTURES. \textit{Materials Structure in Chemistry, Biology, Physics and Technology}. Praha, 2006, roč.~13, č.~3, s.~161. ISSN~1211-5894.
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