VALTR, Miroslav, Petr KLAPETEK, Ivan OHLÍDAL and Václav DUCHOŇ. Study of thickness reduction of a-C:H thin film under UV light irradiation. In Proceedings of ICPIG XXVIII Conference. Prague: Institute of Plasma Physics AS CR, 2007, p. 761-764. ISBN 978-80-87026-01-4.
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Basic information
Original name Study of thickness reduction of a-C:H thin film under UV light irradiation
Name in Czech Studium redukce tlouštky amorfní uhlíkové tenké vrstvy vlivem UV záření
Authors VALTR, Miroslav (203 Czech Republic, guarantor), Petr KLAPETEK (203 Czech Republic), Ivan OHLÍDAL (203 Czech Republic) and Václav DUCHOŇ (203 Czech Republic).
Edition Prague, Proceedings of ICPIG XXVIII Conference, p. 761-764, 4 pp. 2007.
Publisher Institute of Plasma Physics AS CR
Other information
Original language English
Type of outcome Proceedings paper
Field of Study 10305 Fluids and plasma physics
Country of publisher Czech Republic
Confidentiality degree is not subject to a state or trade secret
RIV identification code RIV/00216224:14310/07:00019457
Organization unit Faculty of Science
ISBN 978-80-87026-01-4
Keywords in English Carbon; Oxidation; Optical Properties
Tags Carbon, Optical properties, oxidation
Tags International impact, Reviewed
Changed by Changed by: Mgr. Miroslav Valtr, Ph.D., učo 13715. Changed: 10/1/2010 17:35.
Abstract
In this paper we present a study of thickness reduction of an amorphous hydrocarbon (a-C:H) thin film under UV light irradiation. Optical parameters of the film are examined by means of spectroscopic ellipsometry and area reflectance measurement. We observed a linear dependence in thickness reduction. The reduction velocity is 10.1 nm/h in this region. However, if the thickness of the film was less then approx. 14 nm, the reduction velocity decreases subsequently. Area reflectance measurement consisting in taking reflectance spectra in many points lying along the area of the sample is used to create a map with thickness distribution along this area. This method is very sensitive to small thickness variations.
Abstract (in Czech)
V příspěvku je prezentováno studium redukce tlouštky amorfní uhlíkové tenké vrstvy vlivem UV záření. Optické parametry vrstvy jsou určovány pomocí spektroskopické elipsometrie a plošného měření reflektance. Byla pozorována lineární závislost v poklesu tlouštky vrstvy. Rychlost je poklesu 10,1 nm/h. Avšak pokud byla tlouštka vrstvy menší než cca 14 nm, rychlost poklesu tlouštky vrstvy se postupně zmenšovala. Měření plošné reflektance, spočívající v naměření odrazivosti v mnoha bodech na povrchu vzorku, se využilo ke stanovení rozložení tlouštky. Tato metoda je velmi citlivá k malým změnám tlouštky.
Links
KAN311610701, research and development projectName: Nanometrologie využívající metod rastrovací sondové mikroskopie
Investor: Academy of Sciences of the Czech Republic
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