COLOMBI, Paolo, Dileepa AGNIHOTRI, V. E. ASADCHIKOV, Elza BONTEMPI, D. Keith BOWEN, Chang-Hwan CHANG, Laura E. DEPERO, Mark FARNWORTH, Toshiyuki FUJIMOTO, Alan GIBAUD, Matej JERGEL, Michael KRUMREY, Alessio LAMPERTI, Tamzin LAFFORD, Richard J MATYI, T. MA, Mojmír MEDUŇA, Silvia MILITA, Kenji SAKURAI, Leonid SHABEL'NIKOV, Alexander ULYANENKOV, A. van der LEE a Claudia WIEMER. Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment. J. Appl. Crystallography. Velká Britanie: Int. Union of Crystallography, 2008, roč. 41, č. 1, s. 143-152. ISSN 0021-8898. |
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@article{753356, author = {Colombi, Paolo and Agnihotri, Dileepa and Asadchikov, V. E. and Bontempi, Elza and Bowen, D. Keith and Chang, ChangandHwan and Depero, Laura E. and Farnworth, Mark and Fujimoto, Toshiyuki and Gibaud, Alan and Jergel, Matej and Krumrey, Michael and Lamperti, Alessio and Lafford, Tamzin and Matyi, Richard J and Ma, T. and Meduňa, Mojmír and Milita, Silvia and Sakurai, Kenji and Shabel'nikov, Leonid and Ulyanenkov, Alexander and Lee, A. van der and Wiemer, Claudia}, article_location = {Velká Britanie}, article_number = {1}, keywords = {x-ray reflectometry; round robin; layer structures}, language = {eng}, issn = {0021-8898}, journal = {J. Appl. Crystallography}, title = {Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment}, url = {http://scripts.iucr.org/cgi-bin/paper?he5386}, volume = {41}, year = {2008} }
TY - JOUR ID - 753356 AU - Colombi, Paolo - Agnihotri, Dileepa - Asadchikov, V. E. - Bontempi, Elza - Bowen, D. Keith - Chang, Chang-Hwan - Depero, Laura E. - Farnworth, Mark - Fujimoto, Toshiyuki - Gibaud, Alan - Jergel, Matej - Krumrey, Michael - Lamperti, Alessio - Lafford, Tamzin - Matyi, Richard J - Ma, T. - Meduňa, Mojmír - Milita, Silvia - Sakurai, Kenji - Shabel'nikov, Leonid - Ulyanenkov, Alexander - Lee, A. van der - Wiemer, Claudia PY - 2008 TI - Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment JF - J. Appl. Crystallography VL - 41 IS - 1 SP - 143-152 EP - 143-152 PB - Int. Union of Crystallography SN - 00218898 KW - x-ray reflectometry KW - round robin KW - layer structures UR - http://scripts.iucr.org/cgi-bin/paper?he5386 N2 - X-ray reflectometry (XRR) is a well established technique to evaluate quantitatively electron density, thickness and roughness of thin layers. In this paper, results of the first world-wide XRR round-robin experiment, involving 20 laboratories, are presented and discussed. The round-robin experiment was performed within the framework of the VAMAS Project "X-ray reflectivity measurements for evaluation of thin films and multilayers", the aim of which is to produce a good practice manual for XRR. The reproducibility of measurements obtained using different equipment has been investigated. The influence of the fitting of the experimental data was shown to be non-negligible compared with the experimental factors. The dynamic intensity range proves to be an important parameter for obtaining a good quality measurement. ER -
COLOMBI, Paolo, Dileepa AGNIHOTRI, V. E. ASADCHIKOV, Elza BONTEMPI, D. Keith BOWEN, Chang-Hwan CHANG, Laura E. DEPERO, Mark FARNWORTH, Toshiyuki FUJIMOTO, Alan GIBAUD, Matej JERGEL, Michael KRUMREY, Alessio LAMPERTI, Tamzin LAFFORD, Richard J MATYI, T. MA, Mojmír MEDUŇA, Silvia MILITA, Kenji SAKURAI, Leonid SHABEL'NIKOV, Alexander ULYANENKOV, A. van der LEE a Claudia WIEMER. Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment. \textit{J. Appl. Crystallography}. Velká Britanie: Int. Union of Crystallography, 2008, roč.~41, č.~1, s.~143-152. ISSN~0021-8898.
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