ROCH, Tomáš, Mojmír MEDUŇA, Julian STANGL, Anke HESSE, Rainer T LECHNER, Guenther BAUER, G. DEHLINGER, L. DIEHL, U. GENNSER, Elisabeth MÜLLER and Detlev GRÜTZMACHER. Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies. Journal of Applied Physics. USA: American Institute of Physics, 2001, vol. 91, No 11, p. 8974-8978. ISSN 0021-8979.
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Basic information
Original name Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies
Name in Czech Drsnost rozhraní v SiGe kvantumkaskádových strukturách ze studií rtg reflektivity
Authors ROCH, Tomáš (703 Slovakia), Mojmír MEDUŇA (203 Czech Republic, guarantor), Julian STANGL (40 Austria), Anke HESSE (276 Germany), Rainer T LECHNER (40 Austria), Guenther BAUER (40 Austria), G. DEHLINGER (756 Switzerland), L. DIEHL (756 Switzerland), U. GENNSER (756 Switzerland), Elisabeth MÜLLER (756 Switzerland) and Detlev GRÜTZMACHER (276 Germany).
Edition Journal of Applied Physics, USA, American Institute of Physics, 2001, 0021-8979.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher United States of America
Confidentiality degree is not subject to a state or trade secret
Impact factor Impact factor: 2.128
Organization unit Faculty of Science
UT WoS 000175708900007
Keywords in English superlatitces; multilayers; scattering; quality
Tags multilayers, Quality, SCATTERING, superlatitces
Tags International impact, Reviewed
Changed by Changed by: Mgr. Mojmír Meduňa, Ph.D., učo 7898. Changed: 31/1/2008 15:30.
Abstract
We have investigated the structural properties of Si/SiGe electroluiminescent quantum-cascade structures, by means of x-ray reflectivity and diffraction.
Abstract (in Czech)
Studovali jsme strukturní vlastnosti Si/SiGe elektroluminescentních kvantových kaskádových struktur pomocí rtg reflektivity a difrakce.
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