ŠUSTR, Zdeněk, Aleš KŘENEK, Martin PETŘEK, Jiří FILIPOVIČ, Jan KMUNÍČEK, Jiří WIESNER, Jiří SITERA, František DVOŘÁK and Luděk MATYSKA. Multiple Ligand Trajectory Docking Study: Semiautomatic Analysis of Molecular Dynamics Simulations Using EGEE gLite Services. In Proceedings of the 16th Euromicro Conference on Parallel, Distributed and Network-based Processing. Toulouse, France: IEEE CPS, 2007, p. 447-454. ISBN 978-0-7695-3089-5. |
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@inproceedings{800174, author = {Šustr, Zdeněk and Křenek, Aleš and Petřek, Martin and Filipovič, Jiří and Kmuníček, Jan and Wiesner, Jiří and Sitera, Jiří and Dvořák, František and Matyska, Luděk}, address = {Toulouse, France}, booktitle = {Proceedings of the 16th Euromicro Conference on Parallel, Distributed and Network-based Processing}, keywords = {Grid; service; L&B; JP; job provenance}, language = {eng}, location = {Toulouse, France}, isbn = {978-0-7695-3089-5}, pages = {447-454}, publisher = {IEEE CPS}, title = {Multiple Ligand Trajectory Docking Study: Semiautomatic Analysis of Molecular Dynamics Simulations Using EGEE gLite Services}, year = {2007} }
TY - JOUR ID - 800174 AU - Šustr, Zdeněk - Křenek, Aleš - Petřek, Martin - Filipovič, Jiří - Kmuníček, Jan - Wiesner, Jiří - Sitera, Jiří - Dvořák, František - Matyska, Luděk PY - 2007 TI - Multiple Ligand Trajectory Docking Study: Semiautomatic Analysis of Molecular Dynamics Simulations Using EGEE gLite Services PB - IEEE CPS CY - Toulouse, France SN - 9780769530895 KW - Grid KW - service KW - L&B KW - JP KW - job provenance N2 - Article describing Multiple Ligand Trajectory Docking Study: Semiautomatic analysis of molecular dynamics simulations using EGEE gLite services. ER -
ŠUSTR, Zdeněk, Aleš KŘENEK, Martin PETŘEK, Jiří FILIPOVIČ, Jan KMUNÍČEK, Jiří WIESNER, Jiří SITERA, František DVOŘÁK and Luděk MATYSKA. Multiple Ligand Trajectory Docking Study: Semiautomatic Analysis of Molecular Dynamics Simulations Using EGEE gLite Services. In \textit{Proceedings of the 16th Euromicro Conference on Parallel, Distributed and Network-based Processing}. Toulouse, France: IEEE CPS, 2007, p.~447-454. ISBN~978-0-7695-3089-5.
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