| FERRARI, C., F. GERMINI, D. KORYTÁR, Petr MIKULÍK and L. PEVERINI. X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions. Journal of Applied Crystallography. 2011, vol. 44, No 44, p. 353-358. ISSN 0021-8898. Available from: https://dx.doi.org/10.1107/S0021889811001439. |
Other formats:
BibTeX
LaTeX
RIS
@article{964880,
author = {Ferrari, C. and Germini, F. and Korytár, D. and Mikulík, Petr and Peverini, L.},
article_number = {44},
doi = {http://dx.doi.org/10.1107/S0021889811001439},
keywords = {X-ray diffraction; X-ray optics; Monochromators},
language = {eng},
issn = {0021-8898},
journal = {Journal of Applied Crystallography},
title = {X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions},
url = {http://scripts.iucr.org/cgi-bin/paper?S0021889811001439},
volume = {44},
year = {2011}
}
TY - JOUR
ID - 964880
AU - Ferrari, C. - Germini, F. - Korytár, D. - Mikulík, Petr - Peverini, L.
PY - 2011
TI - X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions
JF - Journal of Applied Crystallography
VL - 44
IS - 44
SP - 353-358
EP - 353-358
SN - 00218898
KW - X-ray diffraction
KW - X-ray optics
KW - Monochromators
UR - http://scripts.iucr.org/cgi-bin/paper?S0021889811001439
L2 - http://scripts.iucr.org/cgi-bin/paper?S0021889811001439
N2 - The width and integrated intensity of the 220 X-ray double-diffraction profile and the shift of the Bragg condition due to refraction have been measured in a channel-cut Ge crystal in an angular range near the critical angle of total external reflection. The Bragg angle and incidence condition were varied by changing the X-ray energy. In agreement with the extended dynamical theory of X-ray diffraction, the integrated intensity of the double diffraction remained almost constant, even for the grazing-incidence condition very close to the critical angle for total external reflection. A broadening of the diffraction profile not predicted by the extended theory of X-ray diffraction was observed when the Bragg condition was at angles of incidence lower than 0.6 deg. Plane wave topographs revealed a contrast that could be explained by a slight residual crystal surface undulation of 0.3 deg due to etching to remove the cutting damage and the increasing effect of refraction at small glancing angles.
ER -
FERRARI, C., F. GERMINI, D. KORYTÁR, Petr MIKULÍK and L. PEVERINI. X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions. \textit{Journal of Applied Crystallography}. 2011, vol.~44, No~44, p.~353-358. ISSN~0021-8898. Available from: https://dx.doi.org/10.1107/S0021889811001439.
|
