| RŮŽIČKA, Jiří a Mojmír MEDUŇA. X-RAY LAUE DIFFRACTION STUDY OF OXYGEN PRECIPITATES IN CZOCHRALSKI SILICON. Materials Structure in Chemistry, Biology, Physics and Technology. Czech Republic: Czech and Slovak Crystallographic Associ, 2011, roč. 18, č. 3, s. 204-208. ISSN 1211-5894. |
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@article{967841,
author = {Růžička, Jiří and Meduňa, Mojmír},
article_location = {Czech Republic},
article_number = {3},
keywords = {Czochralski silicon; oxygen precipitates; x-ray Laue diffraction; statistical dynamical theory of diffraction},
language = {eng},
issn = {1211-5894},
journal = {Materials Structure in Chemistry, Biology, Physics and Technology},
title = {X-RAY LAUE DIFFRACTION STUDY OF OXYGEN PRECIPITATES IN CZOCHRALSKI SILICON},
volume = {18},
year = {2011}
}
TY - JOUR
ID - 967841
AU - Růžička, Jiří - Meduňa, Mojmír
PY - 2011
TI - X-RAY LAUE DIFFRACTION STUDY OF OXYGEN PRECIPITATES IN CZOCHRALSKI SILICON
JF - Materials Structure in Chemistry, Biology, Physics and Technology
VL - 18
IS - 3
SP - 204-208
EP - 204-208
PB - Czech and Slovak Crystallographic Associ
SN - 12115894
KW - Czochralski silicon
KW - oxygen precipitates
KW - x-ray Laue diffraction
KW - statistical dynamical theory of diffraction
N2 - In the presented article, oxygen precipitates in annealed Czochralski silicon were studied by X-ray diffraction in Laue geometry.
ER -
RŮŽIČKA, Jiří a Mojmír MEDUŇA. X-RAY LAUE DIFFRACTION STUDY OF OXYGEN PRECIPITATES IN CZOCHRALSKI SILICON. \textit{Materials Structure in Chemistry, Biology, Physics and Technology}. Czech Republic: Czech and Slovak Crystallographic Associ, 2011, roč.~18, č.~3, s.~204-208. ISSN~1211-5894.
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