Výpis publikací

LÜBBERT, D., C. FERRARI, Petr MIKULÍK, P. PERNOT, L. HELFEN, N. VERDI, D. KORYTÁR a T. BAUMBACH. Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging. J. Appl. Crystallography. Velká Britanie: Int. Union of Crystallography, 2005, roč. 38, č. 1, s. 91-96. ISSN 0021-8898.

FERRARI, C., N. VERDI, D. LÜBBERT, D. KORYTÁR, Petr MIKULÍK, T. BAUMBACH, L. HELFEN a P. PERNOT. Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique. Proceedings of SPIE: Crystals, Multilayers, and Other Synchrotron Optics. USA: SPIE, 2003, roč. 5195, č. 1, s. 84-93. ISSN 0-8194-5068-5.

MIKULÍK, Petr, D. LÜBBERT, D. KORYTÁR, P. PERNOT a T. BAUMBACH. Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2003, roč. 36, č. 1, s. A74-A78, 5 s. ISSN 0022-3727.

MIKULÍK, Petr, T. BAUMBACH, D. KORYTÁR, P. PERNOT, D. LÜBBERT, L. HELFEN a Ch. LANDESBERGER. Advanced X-ray diffraction imaging techniques for semiconductor wafer characterisation. Materials Structure. Praha: The Czech and Slovak Cryst. Assoc., 2002, roč. 9, č. 2, s. 87-88. ISSN 1211-5894.