Publication Records

KAGANER, V.M., B. JENICHEN, G. PARIS, K.H. PLOOG, O. KONOVALOV, Petr MIKULÍK and S. ARAI. Strain in buried quantum wires: Analytical calculations and x-ray diffraction study. Phys. Rev. B. USA: The American Phys. Society, 2002, vol. 2002, No 66, p. 035310-35316. ISSN 0163-1829.

ULYANENKOV, A., K. INABA, Petr MIKULÍK, N. DAROWSKI, K. OMOTE, J. GRENZER and A. FORCHEL. X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2001, vol. 34, 10A, p. A179, 4 pp. ISSN 0022-3727.

ZHUANG, Y., Václav HOLÝ, J. STANGL, A.A. DARHUBER, Petr MIKULÍK, S. ZERLAUTH, F. SCHÄFFLER, G. BAUER, N. DAROWSKI, D. LÜBBERT and U. PIETSCH. Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 1999, vol. 32, No 9999, p. A224, 6 pp. ISSN 0022-3727.

ZHUANG, Y., J. STANGL, A.A. DARHUBER, G. BAUER, Petr MIKULÍK, Václav HOLÝ, N, DAROWSKI and U. PIETSCH. X-ray diffraction from quantum wires and quantum dots. Journal of Materials Science: Materials in Electronics. Great Britain: Kluwer Academic Publishers, 1999, (10)1999, -, p. 215-221. ISSN 0957-4522.