Publication Records

MEDUŇA, Mojmír, Jiří NOVÁK, Günther BAUER, Václav HOLÝ, Claudiu FALUB, Soichiro TSUJINO and Detlev GRÜTZMACHER. In situ investigations of Si and Ge interdiffusion in Ge-rich Si/SiGe multilayers using x-ray scattering. Semicond. Sci. Technol. Velká Britanie: IOP Publishing Ltd, 2007, vol. 22, No 4, p. 447–453. ISSN 0268-1242.

MIKULÍK, Petr. X-ray reflectometry and diffuse scattering. 2007th ed. Smolenice (Slovensko): 7th Autumn School on X-ray scattering from surfaces and thin layers, 2007. international workshop.

MEDUŇA, Mojmír, Jiří NOVÁK, Claudiu FALUB, Günther BAUER and Detlev GRÜTZMACHER. High Temperature in-situ Investigation of Si/SiGe Multilayers and Cascade Structures. Materials Structure in Chemistry, Biology, Physics and Technology. Praha, 2005, vol. 12, No 2, p. 126. ISSN 1211-5894.

MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Günther BAUER, Claudiu FALUB, Soichiro TSUJINO, Elisabeth MÜLLER, Detlev GRÜTZMACHER, Yves CAMPIDELLI, Olivier KERMARREC and Daniel BENSAHEL. Annealing studies of high Ge composition Si/SiGe multilayers. Zeitschrift fur Kristalographie. R. Oldenbourg Verlag GmbH, 2004, vol. 219, No 4, p. 195-200. ISSN 0044-2968.

MIKULÍK, Petr, M. JERGEL, T. BAUMBACH, E. MAJKOVÁ, E. PINČÍK, Š. LUBY, L. ORTEGA, R. TUCOULOU, P. HUDEK and I. KOSTIČ. Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2001, vol. 34, 10A, p. A188, 5 pp. ISSN 0022-3727.

ULYANENKOV, A., K. INABA, Petr MIKULÍK, N. DAROWSKI, K. OMOTE, J. GRENZER and A. FORCHEL. X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2001, vol. 34, 10A, p. A179, 4 pp. ISSN 0022-3727.

JERGEL, M., C. FALCONY, Petr MIKULÍK, L. ORTEGA, E. MAJKOVÁ, E. PINČÍK, Š. LUBY, I. KOSTIČ and P. HUDEK. X-ray reflectivity study of a W/Si multilayer grating. Superficies y Vacío. Mexico: Sociedad Mexicana de Ciencia de Superfic, 2001, vol. 2001, No 13, p. 10-14. ISSN 1665-3521.