Masaryk University

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    2007

    1. Study of nanocrystalline iron phases on Si-SiO2/Fe MWCNT Samples
      JAŠEK, Ondřej, Oldřich SCHNEEWEISS, Bohumil DAVID, Lenka ZAJÍČKOVÁ and Martin VONDRÁČEK. Study of nanocrystalline iron phases on Si-SiO2/Fe MWCNT Samples. In Abstract Booklet of International Conference NANO 07. 1st ed. Brno: VUT Brno, 2007, p. 65-65. ISBN 978-80-214-3460-8.
      More: https://is.muni.cz/publication/747205/en

    2004

    1. In situ analysis of PMPSi by spectroscopic ellipsometry and XPS
      ČECHAL, Jan, Petr TICHOPÁDEK, Alois NEBOJSA, Olga BONAVENTUROVÁ ZRZAVECKÁ, Michal URBÁNEK, Jiří SPOUSTA, Karel NAVRÁTIL and Tomáš ŠIKOLA. In situ analysis of PMPSi by spectroscopic ellipsometry and XPS. Surface and Interface Analysis. USA: John Wiley & Sons, 2004, vol. 2004, No 36, p. 1218-1221. ISSN 0142-2421.
      More: https://is.muni.cz/publication/559741/en

    2003

    1. Surface properties of polyethylene after low-temperature plasma treatment
      DRNOVSKÁ, Hana, Lubomír LAPČÍK, Vilma BURŠÍKOVÁ, Jozef ZEMEK and Ana M. BARROS-TIMMONS. Surface properties of polyethylene after low-temperature plasma treatment. COLLOID AND POLYMER SCIENCE. 2003, vol. 2003, No 281, p. 1025-1033, 8 pp. ISSN 0303-402X.
      More: https://is.muni.cz/publication/490358/en

    2001

    1. XPS and Ellipsometric Study of DLC/Silicon Interface
      ZAJÍČKOVÁ, Lenka, Kateřina VELTRUSKÁ, Nataliya TSUD and Daniel FRANTA. XPS and Ellipsometric Study of DLC/Silicon Interface. Vacuum. USA: ELSEVIER (PERGAMON), 2001, vol. 61, 2-4, p. 269-273. ISSN 0042-207X.
      More: https://is.muni.cz/publication/366095/en
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