Masaryk University

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    2000

    1. Analysis of Slightly Rough Thin Films by Optical Methods and AFM
      FRANTA, Daniel, Ivan OHLÍDAL and Petr KLAPETEK. Analysis of Slightly Rough Thin Films by Optical Methods and AFM. Mikrochim. Acta. Wien: Springer-Verlag, 2000, vol. 132, No 1, p. 443-447. ISSN 0026-3672.
      More: https://is.muni.cz/publication/313891/en

    1998

    1. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries
      FRANTA, Daniel and Ivan OHLÍDAL. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries. Optics Communications. Amsterdam: Elsevier Science, 1998, vol. 147, No 1, p. 349-358. ISSN 0030-4018.
      More: https://is.muni.cz/publication/206015/en
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