Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries

FRANTA, Daniel and Ivan OHLÍDAL. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries. Optics Communications. Amsterdam: Elsevier Science, 1998, vol. 147, No 1, p. 349-358. ISSN 0030-4018.

Basic information

• Original name: Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries
• Authors: FRANTA, Daniel (203 Czech Republic, guarantor) and Ivan OHLÍDAL (203 Czech Republic).
• Edition: Optics Communications, Amsterdam, Elsevier Science, 1998, 0030-4018.

Other information

• Original language: English
• Type of outcome: Article in a journal
• Field of Study: 10306 Optics
• Country of publisher: Netherlands
• Confidentiality degree: is not subject to a state or trade secret
• WWW: URL
• Impact factor: Impact factor: 1.206
• RIV identification code: RIV/00216224:14310/98:00003212
• Organization unit: Faculty of Science
• UT WoS: 000073389100026
• Keywords in English: Near-field optics; Speckle effect; Rough thin films
• Tags: Near-field optics, Rough thin films, Speckle effect

Abstract

In this theoretical paper the basic statistical quantities of the light intensity above thin-film systems with randomly rough boundaries are studied in the near-field. This means that formulae for the mean intensity, standard deviation of the intensity, correlation function of the intensity and the speckle contrast are derived for the systems mentioned in the near-field. It is assumed that the boundaries of the systems are slightly rough, i.e. that the rms values of heights of the irregularities of the boundaries are much smaller than the wavelength of incident light. The Rayleigh-Rice approach is employed for deriving the formulae expressing the quantities specified. In conclusion a brief numerical analysis of the theoretical results is presented.

Links

• GA202/98/0988, research and development project: Name: Charakterizace vrstevnatých systémů s náhodně drsnými rozhraními pomocí optických a rtg metod

Investor: Czech Science Foundation, Characterization of multilayer systems with randomly rough boundaries by means of optical and X - ray methods