Výpis publikací

2001

1. Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy

   FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Pavel POKORNÝ a Miloslav OHLÍDAL. Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 2001, roč. 32, č. 1, s. 91-94. ISSN 0142-2421.

   Podrobněji: https://is.muni.cz/publication/367252/cs