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MISTRÍK, Jan; Tomuo YAMAGUCHI; Daniel FRANTA; Ivan OHLÍDAL; Gu Jin HU a Ning DAI. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 431-434. ISSN 0169-4332.Podrobněji: https://is.muni.cz/publication/621519/cs