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FRANTA, Daniel; Ivan OHLÍDAL; Petr KLAPETEK a Pere ROCA I CABARROCAS. Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 2004, roč. 455-456, č. 1, s. 399-403. ISSN 0040-6090.Podrobněji: https://is.muni.cz/publication/555840/cs