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HARTMANNOVÁ, Mária; Martin JERGEL; Vladislav NAVRÁTIL; Karel NAVRÁTIL; Katarina GMUCOVÁ; F.C. GANDARILLA; Jan ZEMEK; Stefan CHROMIK a Frantiaek KUNDRACIK. Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets. In Acta Physica Slovaca. I. Bratislava: Institute of Physics, SAS, Bratislava, Slovakia, 2005, s. 247-259. ISBN 5-94691-216-X.Podrobněji: https://is.muni.cz/publication/573078/cs