Výpis publikací

2002

1. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method

   KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA a Pavel POKORNÝ. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, roč. 34, č. 1, s. 559-564. ISSN 0142-2421.

   Podrobněji: https://is.muni.cz/publication/404727/cs