FK010 Structural analysis methods in condensed matter physics

Faculty of Science
Autumn 2025
Extent and Intensity
2/1/0. 3 credit(s) (plus extra credits for completion). Type of Completion: zk (examination).
In-person direct teaching
Teacher(s)
doc. Mgr. Ondřej Caha, Ph.D. (lecturer)
doc. Mgr. Ondřej Caha, Ph.D. (seminar tutor)
Mgr. Jiří Novák, Ph.D. (seminar tutor)
Guaranteed by
doc. Mgr. Ondřej Caha, Ph.D.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. Mgr. Ondřej Caha, Ph.D.
Supplier department: Department of Condensed Matter Physics – Physics Section – Faculty of Science
Timetable
Wed 8:00–9:50 F-ucebnaCP,9/01001
  • Timetable of Seminar Groups:
FK010/01: Wed 10:00–10:50 F-ucebnaCP,9/01001
Course Enrolment Limitations
The course is offered to students of any study field.
Abstract
The aim is to introduce students to the basic techniques of structural analysis of condensed matter, which include methods based on the interaction of X-rays with matter and methods using neutron and electron scattering.
Learning outcomes
Upon successful completion of this course, students should be able to
- understand the physical principles of structural methods
- design an appropriate experimental procedure for a given structural problem
- use the experimental facilities of the Institute to determine the structure of a given condensed matter
- evaluate the experimental data and compare with the theoretical model
Key topics
  • 1. Properties of x-rays, Thomson x-ray scattering from an electron, scattering from atoms, atomic form-factor. X-ray absorption, basics of x-ray absorption spectroscopy.
  • 2. Scattering of x-rays from a crystalline solid, x-ray diffraction, kinematical approximation, far-field limit.
  • 3. Kinematical x-ray diffraction from crystalline thin layers, determination of lattice parameters and degree of plastic relaxation of a layer.
  • 4. Diffraction from polycrystals. The Rietveld method, phase analysis.
  • 5. Small-angle x-ray scattering, SAXS and GISAXS methods, x-ray reflection, determination of the layer thickness and roughness of interfaces
  • 6. X-ray scattering from nanostructures, the Debye formula, pair distribution function, determination of mean size of nanoparticles.
  • 7. Coherent diffraction, phase problem in scattering theory.
  • 8. Laboratory and synchrotron x-ray sources, x-ray optics, x-ray detectors.
  • 9. Properties of neutrons, interaction of neutrons with matter, nuclear and magnetic neutron scattering.
  • 10. Neutron sources and detectors, neutron optics.
  • 11. Application of neutron scattering - study of lattice dynamics and magnetic order in solids.
  • 12. Interaction of electrons with matter, penetration depth, quantum description of electron scattering.
  • 13. Transmission electron microscopy - principles and image formation.
  • 14. Scanning electron microscopy, principles, image formation, scanning transmission electron microscopy.
  • 15. Chemical analysis with electrons, methods EELS, EDX, WDX.
  • 16. EBSD method
  • 17. Sample preparation for electron microscopy, FIB method
Study resources and literature
  • SQUIRES, G. L. Introduction to the theory of thermal neutron scattering. Cambridge: Cambridge University Press, 2012, vii, 260. ISBN 9781107644069. info
  • Elements of modern X-ray physics. Edited by J. Als-Nielsen - Des McMorrow. 2nd ed. Chichester, West Sussex: John Wiley, 2011, xii, 419 p. ISBN 9781119997313. info
  • WILLIAMS, David B. and C. Barry CARTER. Transmission electron microscopy : a textbook for materials science. 2nd ed. New York: Springer, 2009, lxii, 760. ISBN 9780387765006. info
  • PIETSCH, Ullrich; Václav HOLÝ and Tilo BAUMBACH. High-resolution X-ray scattering : from thin films to lateral nanostructures. 2nd ed. New York: Springer, 2004, xvi, 408. ISBN 1441923071. info
  • GOLDSTEIN, Joseph I. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer Academic/Plenum publishers, 2003, xix, 689 s. ISBN 0-306-47292-9. info
Approaches, practices, and methods used in teaching
Lecture and exercises. The exercises include laboratory work on instruments in the laboratories of the Institute. The laboratory work will be include the following tasks:
1. Qualitative phase analysis of a polycrystalline sample, Rietveld refinement of atomic positions in a elementary cell
2. Determination of the degree of plastic relaxation in the  epitaxial layer, estimation of the density of misfit dislocations
3. Determination of thin layer thickness and rms interface roughness by X-ray reflection
4. Determination of the mean size of nanoparticles and the degree of correlation of their positions by small-angle X-ray scattering.

The RIGAKU Smartlab9kW and RIGAKU Smartlab3kW diffractometers at the  CEITEC core facility as well as the RIGAKU Smartlab3kW diffractometer at the UFKL (CEPLANT) will be used to  solve these tasks.
Method of verifying learning outcomes and course completion requirements
oral exam the part of the exam is home assignement -- evaluation of selected experimental task.
Language of instruction
Czech
Further Comments
Study Materials
The course is also listed under the following terms Autumn 2019, Autumn 2020, autumn 2021, Autumn 2022, Autumn 2023, Autumn 2024.
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