MOSER, Armin, Jiří NOVÁK, Heinz-Georg FLESCH, Tatjana DJURIC, Oliver WERZER, Anja HAASE a Roland RESEL. Temperature stability of the pentacene thin-film phase. Applied Physics Letters. MELVILLE: AMER INST PHYSICS, 2011, roč. 99, č. 22, 3 s. ISSN 0003-6951. Dostupné z: https://dx.doi.org/10.1063/1.3665188. |
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@article{1123340, author = {Moser, Armin and Novák, Jiří and Flesch, HeinzandGeorg and Djuric, Tatjana and Werzer, Oliver and Haase, Anja and Resel, Roland}, article_location = {MELVILLE}, article_number = {22}, doi = {http://dx.doi.org/10.1063/1.3665188}, keywords = {crystal morphology; organic semiconductors; semiconductor thin films; thermal expansion; X-ray diffraction}, language = {eng}, issn = {0003-6951}, journal = {Applied Physics Letters}, title = {Temperature stability of the pentacene thin-film phase}, volume = {99}, year = {2011} }
TY - JOUR ID - 1123340 AU - Moser, Armin - Novák, Jiří - Flesch, Heinz-Georg - Djuric, Tatjana - Werzer, Oliver - Haase, Anja - Resel, Roland PY - 2011 TI - Temperature stability of the pentacene thin-film phase JF - Applied Physics Letters VL - 99 IS - 22 PB - AMER INST PHYSICS SN - 00036951 KW - crystal morphology KW - organic semiconductors KW - semiconductor thin films KW - thermal expansion KW - X-ray diffraction ER -
MOSER, Armin, Jiří NOVÁK, Heinz-Georg FLESCH, Tatjana DJURIC, Oliver WERZER, Anja HAASE a Roland RESEL. Temperature stability of the pentacene thin-film phase. \textit{Applied Physics Letters}. MELVILLE: AMER INST PHYSICS, 2011, roč.~99, č.~22, 3 s. ISSN~0003-6951. Dostupné z: https://dx.doi.org/10.1063/1.3665188.
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