| MOSER, Armin, Jiří NOVÁK, Heinz-Georg FLESCH, Tatjana DJURIC, Oliver WERZER, Anja HAASE a Roland RESEL. Temperature stability of the pentacene thin-film phase. Applied Physics Letters. MELVILLE: AMER INST PHYSICS, 2011, roč. 99, č. 22, 3 s. ISSN 0003-6951. Dostupné z: https://dx.doi.org/10.1063/1.3665188. |
Další formáty:
BibTeX
LaTeX
RIS
@article{1123340,
author = {Moser, Armin and Novák, Jiří and Flesch, HeinzandGeorg and Djuric, Tatjana and Werzer, Oliver and Haase, Anja and Resel, Roland},
article_location = {MELVILLE},
article_number = {22},
doi = {http://dx.doi.org/10.1063/1.3665188},
keywords = {crystal morphology; organic semiconductors; semiconductor thin films; thermal expansion; X-ray diffraction},
language = {eng},
issn = {0003-6951},
journal = {Applied Physics Letters},
title = {Temperature stability of the pentacene thin-film phase},
volume = {99},
year = {2011}
}
TY - JOUR
ID - 1123340
AU - Moser, Armin - Novák, Jiří - Flesch, Heinz-Georg - Djuric, Tatjana - Werzer, Oliver - Haase, Anja - Resel, Roland
PY - 2011
TI - Temperature stability of the pentacene thin-film phase
JF - Applied Physics Letters
VL - 99
IS - 22
PB - AMER INST PHYSICS
SN - 00036951
KW - crystal morphology
KW - organic semiconductors
KW - semiconductor thin films
KW - thermal expansion
KW - X-ray diffraction
ER -
MOSER, Armin, Jiří NOVÁK, Heinz-Georg FLESCH, Tatjana DJURIC, Oliver WERZER, Anja HAASE a Roland RESEL. Temperature stability of the pentacene thin-film phase. \textit{Applied Physics Letters}. MELVILLE: AMER INST PHYSICS, 2011, roč.~99, č.~22, 3 s. ISSN~0003-6951. Dostupné z: https://dx.doi.org/10.1063/1.3665188.
|
