| FRANK, C., R. BANERJEE, M. OETTEL, A. GERLACH, Jiří NOVÁK, G. SANTORO a F. SCHREIBER. Analysis of island shape evolution from diffuse x-ray scattering of organic thin films and implications for growth. Physical Review B. College (USA): American Institute of Physics, 2014, roč. 90, č. 20, s. "205401", 10 s. ISSN 1098-0121. Dostupné z: https://dx.doi.org/10.1103/PhysRevB.90.205401. |
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@article{1211741,
author = {Frank, C. and Banerjee, R. and Oettel, M. and Gerlach, A. and Novák, Jiří and Santoro, G. and Schreiber, F.},
article_location = {College (USA)},
article_number = {20},
doi = {http://dx.doi.org/10.1103/PhysRevB.90.205401},
keywords = {thin film growth; island formation; organic semiconductors; diindenoperylene; grazing incidence small angle x-ray scattering; small-angle scattering theory},
language = {eng},
issn = {1098-0121},
journal = {Physical Review B},
title = {Analysis of island shape evolution from diffuse x-ray scattering of organic thin films and implications for growth},
url = {http://link.aps.org/doi/10.1103/PhysRevB.90.205401},
volume = {90},
year = {2014}
}
TY - JOUR
ID - 1211741
AU - Frank, C. - Banerjee, R. - Oettel, M. - Gerlach, A. - Novák, Jiří - Santoro, G. - Schreiber, F.
PY - 2014
TI - Analysis of island shape evolution from diffuse x-ray scattering of organic thin films and implications for growth
JF - Physical Review B
VL - 90
IS - 20
SP - "205401"
EP - "205401"
PB - American Institute of Physics
SN - 10980121
KW - thin film growth
KW - island formation
KW - organic semiconductors
KW - diindenoperylene
KW - grazing incidence small angle x-ray scattering
KW - small-angle scattering theory
UR - http://link.aps.org/doi/10.1103/PhysRevB.90.205401
L2 - http://link.aps.org/doi/10.1103/PhysRevB.90.205401
N2 - Understanding the growth of organic semiconducting molecules with shape anisotropy is of high relevance to the processing of optoelectronic devices. This work provides insight into the growth of thin films of the prototypical rodlike organic semiconductor diindenoperylene on a microscopic level by analyzing in detail the film morphology. We model our data, which were obtained by high-resolution grazing incidence small-angle x-ray scattering, using a theoretical description from small-angle scattering theory derived for simple liquids. Based on form-factor calculations for different object types, we determine how the island shapes change in the respective layers. Atomic force microscopy measurements approve our findings.
ER -
FRANK, C., R. BANERJEE, M. OETTEL, A. GERLACH, Jiří NOVÁK, G. SANTORO a F. SCHREIBER. Analysis of island shape evolution from diffuse x-ray scattering of organic thin films and implications for growth. \textit{Physical Review B}. College (USA): American Institute of Physics, 2014, roč.~90, č.~20, s.~''205401'', 10 s. ISSN~1098-0121. Dostupné z: https://dx.doi.org/10.1103/PhysRevB.90.205401.
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