J 2018

Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory

ČERMÁK, Martin; Jiří VOHÁNKA; Ivan OHLÍDAL and Daniel FRANTA

Basic information

Original name

Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory

Authors

ČERMÁK, Martin (203 Czech Republic, guarantor, belonging to the institution); Jiří VOHÁNKA (203 Czech Republic, belonging to the institution); Ivan OHLÍDAL (203 Czech Republic, belonging to the institution) and Daniel FRANTA (203 Czech Republic, belonging to the institution)

Edition

Journal of modern optics, Taylor & Francis, 2018, 0950-0340

Other information

Language

English

Type of outcome

Article in a journal

Field of Study

10306 Optics

Country of publisher

United Kingdom of Great Britain and Northern Ireland

Confidentiality degree

is not subject to a state or trade secret

References:

Impact factor

Impact factor: 1.657

RIV identification code

RIV/00216224:14310/18:00103626

Organization unit

Faculty of Science

UT WoS

000435121500010

EID Scopus

2-s2.0-85048549230

Keywords in English

Multilayer systems; rough boundaries; ellipsometric parameters; reflectance; transmittance
Changed: 11/9/2018 16:50, Mgr. Martin Čermák, Ph.D.

Abstract

In the original language

In this paper the exact approach of the Rayleigh–Rice theory enabling us to calculate optical quantities of multi-layer systems with boundaries exhibiting slight random roughness is presented. This approach is exact in the sense that it takes into account the propagation of perturbed electromagnetic fields (waves) among randomly rough boundaries including all cross-correlation and auto-correlation effects. The restriction to the second order of perturbation, which is the lowest order that gives nonzero corrections to coherent waves (obeying the Snell’s law), represents the only approximation used in our calculations. It is assumed that the layers and the substrates are formed by optically homogeneous and isotropic materials. The formulae obtained in the theoretical part are used to investigate the influence of layer thicknesses and roughness parameters on reflectances and associated ellipsometric parameters of the selected numerical examples of a three-layer system. The presented approach represents the generalization of the exact approach for single-layer systems and the improvement of the approximate approach for multi-layer systems published earlier. The exact approach of the RRT has a substantial importance for the optical characterization of multi-layer systems occurring in applied research and optics industry applications.

Links

LO1411, research and development project
Name: Rozvoj centra pro nízkonákladové plazmové a nanotechnologické povrchové úpravy (Acronym: CEPLANT plus)
Investor: Ministry of Education, Youth and Sports of the CR