2018
Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory
ČERMÁK, Martin; Jiří VOHÁNKA; Ivan OHLÍDAL and Daniel FRANTABasic information
Original name
Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory
Authors
ČERMÁK, Martin (203 Czech Republic, guarantor, belonging to the institution); Jiří VOHÁNKA (203 Czech Republic, belonging to the institution); Ivan OHLÍDAL (203 Czech Republic, belonging to the institution) and Daniel FRANTA (203 Czech Republic, belonging to the institution)
Edition
Journal of modern optics, Taylor & Francis, 2018, 0950-0340
Other information
Language
English
Type of outcome
Article in a journal
Field of Study
10306 Optics
Country of publisher
United Kingdom of Great Britain and Northern Ireland
Confidentiality degree
is not subject to a state or trade secret
References:
Impact factor
Impact factor: 1.657
RIV identification code
RIV/00216224:14310/18:00103626
Organization unit
Faculty of Science
UT WoS
000435121500010
EID Scopus
2-s2.0-85048549230
Keywords in English
Multilayer systems; rough boundaries; ellipsometric parameters; reflectance; transmittance
Changed: 11/9/2018 16:50, Mgr. Martin Čermák, Ph.D.
Abstract
In the original language
In this paper the exact approach of the Rayleigh–Rice theory enabling us to calculate optical quantities of multi-layer systems with boundaries exhibiting slight random roughness is presented. This approach is exact in the sense that it takes into account the propagation of perturbed electromagnetic fields (waves) among randomly rough boundaries including all cross-correlation and auto-correlation effects. The restriction to the second order of perturbation, which is the lowest order that gives nonzero corrections to coherent waves (obeying the Snell’s law), represents the only approximation used in our calculations. It is assumed that the layers and the substrates are formed by optically homogeneous and isotropic materials. The formulae obtained in the theoretical part are used to investigate the influence of layer thicknesses and roughness parameters on reflectances and associated ellipsometric parameters of the selected numerical examples of a three-layer system. The presented approach represents the generalization of the exact approach for single-layer systems and the improvement of the approximate approach for multi-layer systems published earlier. The exact approach of the RRT has a substantial importance for the optical characterization of multi-layer systems occurring in applied research and optics industry applications.
Links
LO1411, research and development project |
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