2018
Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory
ČERMÁK, Martin; Jiří VOHÁNKA; Ivan OHLÍDAL a Daniel FRANTAZákladní údaje
Originální název
Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory
Autoři
ČERMÁK, Martin (203 Česká republika, garant, domácí); Jiří VOHÁNKA (203 Česká republika, domácí); Ivan OHLÍDAL (203 Česká republika, domácí) a Daniel FRANTA (203 Česká republika, domácí)
Vydání
Journal of modern optics, Taylor & Francis, 2018, 0950-0340
Další údaje
Jazyk
angličtina
Typ výsledku
Článek v odborném periodiku
Obor
10306 Optics
Stát vydavatele
Velká Británie a Severní Irsko
Utajení
není předmětem státního či obchodního tajemství
Odkazy
Impakt faktor
Impact factor: 1.657
Kód RIV
RIV/00216224:14310/18:00103626
Organizační jednotka
Přírodovědecká fakulta
UT WoS
000435121500010
EID Scopus
2-s2.0-85048549230
Klíčová slova anglicky
Multilayer systems; rough boundaries; ellipsometric parameters; reflectance; transmittance
Změněno: 11. 9. 2018 16:50, Mgr. Martin Čermák, Ph.D.
Anotace
V originále
In this paper the exact approach of the Rayleigh–Rice theory enabling us to calculate optical quantities of multi-layer systems with boundaries exhibiting slight random roughness is presented. This approach is exact in the sense that it takes into account the propagation of perturbed electromagnetic fields (waves) among randomly rough boundaries including all cross-correlation and auto-correlation effects. The restriction to the second order of perturbation, which is the lowest order that gives nonzero corrections to coherent waves (obeying the Snell’s law), represents the only approximation used in our calculations. It is assumed that the layers and the substrates are formed by optically homogeneous and isotropic materials. The formulae obtained in the theoretical part are used to investigate the influence of layer thicknesses and roughness parameters on reflectances and associated ellipsometric parameters of the selected numerical examples of a three-layer system. The presented approach represents the generalization of the exact approach for single-layer systems and the improvement of the approximate approach for multi-layer systems published earlier. The exact approach of the RRT has a substantial importance for the optical characterization of multi-layer systems occurring in applied research and optics industry applications.
Návaznosti
LO1411, projekt VaV |
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