Characterization of nanoblisters on HOPG surface

J 2019

Characterization of nanoblisters on HOPG surface

SOBOLA, Dinara, Nikola PAPEŽ, Rashid DALLAEV, Shikhgasan RAMAZANOV, Dušan HEMZAL et. al.

Základní údaje

Originální název

Characterization of nanoblisters on HOPG surface

Autoři

SOBOLA, Dinara, Nikola PAPEŽ (203 Česká republika, garant), Rashid DALLAEV, Shikhgasan RAMAZANOV, Dušan HEMZAL (203 Česká republika, domácí) a Vladimír HOLCMAN (203 Česká republika)

Vydání

Journal of Electrical Engineering, Bratislava, Slovak University of Technology, 2019, 1335-3632

Další údaje

Jazyk

angličtina

Typ výsledku

Článek v odborném periodiku

Obor

21001 Nano-materials

Stát vydavatele

Slovensko

Utajení

není předmětem státního či obchodního tajemství

Odkazy

Full Text

Impakt faktor

Impact factor: 0.686

Kód RIV

RIV/00216224:14310/19:00113014

Organizační jednotka

Přírodovědecká fakulta

DOI

http://dx.doi.org/10.2478/jee-2019-0055

UT WoS

000489301300020

Klíčová slova anglicky

graphite; nitric acid; surface; delamination; topography

Štítky

rivok

Příznaky

Mezinárodní význam, Recenzováno

Změněno: 16. 3. 2020 11:49, Mgr. Marie Šípková, DiS.

Anotace

V originále

We report on influence of the surface functionalization on the properties of highly oriented pyrolytic graphite. The samples were processed in nitric acid and characterized by XPS, Raman and EDX spectroscopies, AFM, SEM and optical microscopy. It is shown that interaction of nitric acid with the surface of HOPG leads to two types of reactions: oxidation of the graphite and intercalation of the nitrate ions at the blistered areas.

Návaznosti

LM2015041, projekt VaV

Název: CEITEC Nano

Investor: Ministerstvo školství, mládeže a tělovýchovy ČR, CEITEC Nano

LQ1601, projekt VaV

Název: CEITEC 2020 (Akronym: CEITEC2020)

Investor: Ministerstvo školství, mládeže a tělovýchovy ČR, CEITEC 2020

Citovat

SOBOLA, Dinara, Nikola PAPEŽ, Rashid DALLAEV, Shikhgasan RAMAZANOV, Dušan HEMZAL a Vladimír HOLCMAN. Characterization of nanoblisters on HOPG surface. Journal of Electrical Engineering. Bratislava: Slovak University of Technology, 2019, roč. 70, č. 7, s. 132-136. ISSN 1335-3632. Dostupné z: https://dx.doi.org/10.2478/jee-2019-0055.

@article{1625257,
   author = {Sobola, Dinara and Papež, Nikola and Dallaev, Rashid and Ramazanov, Shikhgasan and Hemzal, Dušan and Holcman, Vladimír},
   article_location = {Bratislava},
   article_number = {7},
   doi = {http://dx.doi.org/10.2478/jee-2019-0055},
   keywords = {graphite; nitric acid; surface; delamination; topography},
   language = {eng},
   issn = {1335-3632},
   journal = {Journal of Electrical Engineering},
   title = {Characterization of nanoblisters on HOPG surface},
   url = {https://content.sciendo.com/view/journals/jee/70/7/article-p132.xml},
   volume = {70},
   year = {2019}
}

TY  - JOUR
ID  - 1625257
AU  - Sobola, Dinara - Papež, Nikola - Dallaev, Rashid - Ramazanov, Shikhgasan - Hemzal, Dušan - Holcman, Vladimír
PY  - 2019
TI  - Characterization of nanoblisters on HOPG surface
JF  - Journal of Electrical Engineering
VL  - 70
IS  - 7
SP  - 132-136
EP  - 132-136
PB  - Slovak University of Technology
SN  - 13353632
KW  - graphite
KW  - nitric acid
KW  - surface
KW  - delamination
KW  - topography
UR  - https://content.sciendo.com/view/journals/jee/70/7/article-p132.xml
L2  - https://content.sciendo.com/view/journals/jee/70/7/article-p132.xml
N2  - We report on influence of the surface functionalization on the properties of highly oriented pyrolytic graphite. The samples were processed in nitric acid and characterized by XPS, Raman and EDX spectroscopies, AFM, SEM and optical microscopy. It is shown that interaction of nitric acid with the surface of HOPG leads to two types of reactions: oxidation of the graphite and intercalation of the nitrate ions at the blistered areas.
ER  -

SOBOLA, Dinara, Nikola PAPEŽ, Rashid DALLAEV, Shikhgasan RAMAZANOV, Dušan HEMZAL a Vladimír HOLCMAN. Characterization of nanoblisters on HOPG surface. \textit{Journal of Electrical Engineering}. Bratislava: Slovak University of Technology, 2019, roč.~70, č.~7, s.~132-136. ISSN~1335-3632. Dostupné z: https://dx.doi.org/10.2478/jee-2019-0055.

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