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@inproceedings{1686869,
author = {Jonáš, Martin and Strejček, Jan},
address = {Cham (Switzerland)},
booktitle = {Theory and Applications of Satisfiability Testing - SAT 2020 - 23rd International Conference, Alghero, Italy, July 3-10, 2020, Proceedings},
doi = {http://dx.doi.org/10.1007/978-3-030-51825-7_27},
editor = {Luca Pulina and Martina Seidl},
keywords = {SMT solving; bit-vector logic; Boolector; Q3B},
howpublished = {elektronická verze "online"},
language = {eng},
location = {Cham (Switzerland)},
isbn = {978-3-030-51824-0},
pages = {378-393},
publisher = {Springer},
title = {Speeding up Quantified Bit-Vector SMT Solvers by Bit-Width Reductions and Extensions},
url = {https://link.springer.com/chapter/10.1007%2F978-3-030-51825-7_27},
year = {2020}
}
TY - JOUR
ID - 1686869
AU - Jonáš, Martin - Strejček, Jan
PY - 2020
TI - Speeding up Quantified Bit-Vector SMT Solvers by Bit-Width Reductions and Extensions
PB - Springer
CY - Cham (Switzerland)
SN - 9783030518240
KW - SMT solving
KW - bit-vector logic
KW - Boolector
KW - Q3B
UR - https://link.springer.com/chapter/10.1007%2F978-3-030-51825-7_27
L2 - https://link.springer.com/chapter/10.1007%2F978-3-030-51825-7_27
N2 - Recent experiments have shown that satisfiability of a quantified bit-vector formula coming from practical applications almost never changes after reducing all bit-widths in the formula to a small number of bits. This paper proposes a novel technique based on this observation. Roughly speaking, a given quantified bit-vector formula is reduced and sent to a solver, an obtained model is then extended to the original bit-widths and verified against the original formula. We also present an experimental evaluation demonstrating that this technique can significantly improve the performance of state-of-the-art smt solvers Boolector, CVC4, and Q3B on quantified bit-vector formulas from the smt-lib repository.
ER -
JONÁŠ, Martin a Jan STREJČEK. Speeding up Quantified Bit-Vector SMT Solvers by Bit-Width Reductions and Extensions. In Luca Pulina and Martina Seidl. \textit{Theory and Applications of Satisfiability Testing - SAT 2020 - 23rd International Conference, Alghero, Italy, July 3-10, 2020, Proceedings}. Cham (Switzerland): Springer. s.~378-393. ISBN~978-3-030-51824-0. doi:10.1007/978-3-030-51825-7\_{}27. 2020.
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